Part of the Oxford Instruments Group
Date: 18.11.2020
Upcoming Webinar: High-resolution materials characterisation

Pushing the boundaries of elemental characterisation and imaging in materials

Webinar: 18th November 2020 

Do you struggle with high-resolution nanoscale SEM-based characterisation? Join us in our upcoming webinar, where the speakers will identify the challenges, and provide information on optimising microscope conditions to maximise results, demonstrating the strengths of combining high-resolution SEM with windowless EDS analysis to enable nanometre chemical analysis of key material features.

Key learning objectives: 

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We have two sessions for you to choose from. Simply pick your preferred time and save your space today.

*Note: below times are in GMT   
9:00 - 10:00 AM GMT 4:00 - 5:00 PM GMT
Dr. Sam Marks

Presenter: Dr. Sam Marks | Oxford Instruments

Dr. Sam Marks graduated with a doctorate in Physics. He joined Oxford Instruments in 2018 and has always worked with a strong focus on electron microscopy. Sam has focused his research on S/TEM, in particular in-situ characterisation. He is currently working as a TEM Product Manager within the EDS Product Marketing team.
Dr. Kaoru Sato

Presenter: Dr. Kaoru Sato | JFE Techno-Research

Dr. Sato started his career as an engineer early 1980's. In 1989 he received a Ph.D. from the University of Cambridge, U.K. In 2005, Kaoru began working at JFE steel as the General Manager of the Analysis & Characterisation Research Department. In 2011 he advanced to Principal Researcher at JFE Steel Coropration. From 2016 onwards, he has worked as a fellow of JFE-TEC, specialising in electron microscopy and microbeam analysis.
Dr. Ben Tordoff

Presenter: Dr. Ben Tordoff | Zeiss

Dr. Ben Tordoff is the current head of materials science at ZEISS Research Microscopy Solutions. Driven by an interest in multimodal and multiscale analytical microscopy, Ben has held several positions over his almost ten-year career at ZEISS and currently drives strategy related to artificial intelligence, correlative microscopy, and multiscale imaging and analysis across a broad range of materials science challenges. As part of his role, he also acts as a guest lecturer in analytical microscopy and industrial Ph.D. supervisor at several E.U. universities.

Ultim® Extreme

Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers up to 15x greater sensitivity than a conventional large area SDD.

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