The X-MaxN range of SDD for TEM exploits a new sensor chip, new electronics, and innovative packaging to deliver a truly ‘next generation’ SDD performance.
This windowless silicon drift detector sensor for TEM applications provides a collection solid angle in the range 0.3 to 0.7 steradians*. Its superb collection efficiency over the…
Our flagship SDD detector for TEM, the X-MaxN 100TLE provides the perfect solution for field emission and aberration corrected TEMs working at the frontiers of nanoscience.
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