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X-MaxN 100TLE

Our flagship SDD detector for TEM, the X-MaxN 100TLE provides the perfect solution for field emission and aberration corrected TEMs working at the frontiers of nanoscience.

  • The X-MaxN 100TLE exploits a new sensor shape, a windowless configuration, and an innovative mechanical design to deliver truly ‘next generation’ SDD performance. This combination provides unrivaled enhancement in sensitivity for all elements.
  • For example, it will detect much lower concentration of elements when acquiring under the same conditions as a conventional detector Analyse impurities and dopants at the nanoscale
  • Collect more data before the beam degrades sensitive samples Analyse nanoparticles and nanotubes to new levels of detail


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Windowless Detector
  • Windowless detectors provide more counts at all energies with unrivalled low energy performance.

Collection efficiency is significantly improved compared to detectors of a similar solid angle that need to use a thin window.
  • Sensitivity to N Kα is increased almost 3x
  • Sensitivity to O Kα is doubled
  • Be Kα and Si Lα peaks are easily detected
  • Higher energy sensitivity increased by 40-45%
  • No compromise in peak-to-background ratio or resolution

Specially optimised AZtecTEM Tru-Q® analysis algorithm delivers accurate AutoID and quantitative analysis at all energies
For example, it will:
  • Detect much lower concentration of elements when acquiring under the same conditions as a conventional detector Analyse impurities and dopants at the nanoscale
  • Collect more data before the beam degrades sensitive samples Analyse nanoparticles and nanotubes to new levels of detail

Outstanding performance
  • Maximises count rate at the nano- and pico-scale
  • Unique sensor design brings 100 mm2 active area closer to the sample for ultra high solid angle
  • Windowless configuration ensures the best sensitivity for all elements and unrivalled detection of low energy X-rays
  • Performs accurate quant at count rates >100Kcps with accurate pulse pile up correction

Outstanding practicality
  • Easily installed and retrofitable to existing columns
  • Auto-retraction with flap for protection against electron flux damage
  • Pressure sensor automatically protects the detector in case of vacuum loss
  • LN2-free operation
  • No need to tilt sample to optimise solid angle
Fast Atomic column mappingomic column mapping

The outstanding solid angle, sensitivity and speed of the X-MaxN 100TLE are vital to collection at atomic level magnifications.Specimen drift, beam damage and contamination - challenges that have been limiting factors in the past - have now been solved.

X-ray maps and linescans can now be collected in a dramatically shorter time without compromising performance. This increase in performance makes the X-MaxN 100TLE a must where ultra-high resolution analysis is performed down to the atomic level and the signal is extremely low. The detector also handles count rates in high beam current regimes.

Oxford Instruments thanks the Faculty and Staff of the EMS, University of Illinois, Chicago for their help in preparing these data.

Fast automatic phase analysis

For a more detailed analysis of multiphase systems, AZtecTEM AutoPhaseMap creates a phase map of the specimen using statistical variations rather than clustering or principle components. It provides an unrivalled qualitative and uantitative analysis of automatically identified phases.

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