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X-MaxN 80T

The X-MaxN range of SDD for TEM exploits a new sensor chip, new electronics, and innovative packaging to deliver a truly ‘next generation’ SDD performance.

  • X-MaxN TEM detectors use the latest low noise detector designs for excellent resolution and sensitivity – even at high count rates.

  • Specially designed for routine TEM applications, the large-area 80 mm2 sensor of the X-MaxN 80 T provides superb solid angle and analytical performance.

  • Designed to maximise throughput and low energy sensitivity
  • Excellent resolution with guaranteed Mn specification at 50,000 cps
  • Optimised take-off angle for best peak-to-background ratios and light element detection
  • Proven performance on all classes of TEM including field emission, aberration corrected microscopes
  • Count rates conducive to acquiring X-ray maps quickly, including real-time background removal and peak deconvolution using AZtecTEM TruMap software


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Using a large sensor means
  • Productive count rates at low beam currents
  • Maximising imaging performance and accuracy
  • No need to change imaging conditions for X-ray analysis
  • Significantly higher count rates at the same beam current
  • Shorter acquisition times
  • Better statistical confidence
  • Practical analysis with small beam diameters
  • Maximising spatial resolution
  • Getting the best out of your high resolution TEM

Size matters, sensitivity counts

  • Under the same operating conditions, bigger detectors.
  • Will do in seconds what used to take minutes – mapping can be an everyday tool.
  • Will dramatically improve precision for the same acquisition time.
  • Large Area detectors – high-speed microanalysis is routine for all.
  • Low energy spectra easily identified.

Low energy matters, sensitivity counts

  • X-MaxN 80 T is optimised for low energy performance – no compromise on size.
  • Be detection guaranteed on all detectors, Si Ll can be mapped.
  • Very Large Area detectors – low energy analysis is practical for all.

Size matters, spatial resolution counts

  • High spatial resolution conditions give low X-ray yield.
  • Large area detectors collect high quality low energy spectra in practical time scales.
  • Nanoscale features can be better characterised.
  • Very Large Area detectors – advanced nanoanalysis is possible for all.

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