The X-MaxN range of SDD for TEM exploits a new sensor chip, new electronics, and innovative packaging to deliver a truly ‘next generation’ SDD performance.
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X-MaxN TEM detectors use the latest low noise detector designs for excellent resolution and sensitivity – even at high count rates.
Specially designed for routine TEM applications, the large-area 80 mm2 sensor of the X-MaxN 80 T provides superb solid angle and analytical performance.
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Size matters, sensitivity counts
Low energy matters, sensitivity counts
Size matters, spatial resolution counts
Oxford Instruments, the global leader in microanalysis systems, is proud…
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