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AZtecAsbestos

Introducing:
AZtecAsbestos

Transforming your fibre analysis

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Practical guide to high count rate EDS analysis

New: Webinar
Practical guide to high count rate EDS analysis

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AZtecGeo

Introducing:
AZtecGeo

Conducting high-quality compositional & textural analysis over large areas

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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

Featured products

Start with nano to explore the infinite, a breakthrough solution for ultra-high resolution FEG-SEM.
Ultim Extreme Infinity ∞
Delivering real-time insights on your Oxford Instruments system to your phone, tablet or PC - stay informed, wherever you are
Oi View
A new SEM imaging technique combines backscattered electrons and X-ray signals to produce high-definition colour images with embedded elemental data
Unity BEX Detector

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Latest News & Events

Nov 12, 2024
EDS gets even faster, simpler, more accurate,…

Oxford Instruments has launched Ultim® Max ‘Infinity’, the latest generation of the world’s most advanced EDS detector range.…

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Oct 30, 2024
NanoAnalysis Scientific Paper Award 2024…

Oxford Instruments Scientific Paper Award 2024 recognises Outstanding scientific papers published 2024 that include results acquired…

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Aug 1, 2024
Unity - winner of prestigious industry award…

Oxford Instruments, a market-leading technology company with a track record of over 60 years of accelerating scientific breakthroughs,…

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Apr
29
AZtecCrystal EBSD Data Processing…
Location: University of Sydney, Sydney, Australia
Businesses Attending:
NanoAnalysis, OI Academy
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May
6
AIV XXVII Conference
Location: Torino Italy
Businesses Attending:
NanoAnalysis
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