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3 Steps to Optimise FIB Lamella Quality

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Characterising Materials for Use in Extreme Environments
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Ultim Max & AZtecTEM
NEW Ultim Max & AZtecTEM

Unparalleled elemental characterisation performance in the TEM.

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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.
Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

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Featured products

A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and performance,…

OmniProbe 400

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Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

Ultim Extreme

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Symmetry is the revolutionary all-in-one EBSD detector based on groundbreaking CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and…

Symmetry

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National Taiwan University - Oxford Instruments Microscopy School…

National Taiwan University - Oxford Instruments Microscopy School 2019

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AZtecTEM: The next generation of EDS for TEM

Oxford Instruments, the global leader in nanoanalysis systems, is proud…

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Symmetry EBSD Detector Reduces Acquisition Time Drastically For TATA…

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British Embassy Open Day 2018

British Embassy Open Day 2018

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