Providing leading-edge tools for SEM, TEM & FIB - Nanoanalysis

New: Tutorial
Resolving X-ray line overlaps & identifying trace elements using WDS Scan in AZtecWave

Introducing:
Live Chemical Imaging

The only system enabling you to view sample
morphology & elemental distribution, simultaneously
& continuously as you move around your sample

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Introducing:
WDS Scan in
AZtecWave

For resolving X-ray peak overlaps & providing
certainty on the presence of elements in your
samples, including those in minor to trace
concentrations

Find out more

What can we help you with today?

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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

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