Providing leading-edge tools for SEM, TEM & FIB - Nanoanalysis

Introducing:
Symmetry S2

Find out more

New Webinar
Relate:

Correlative Data Visualisation &
Analysis

Watch on-demand

Introducing:
Wave

Discover Now

What can we help you with today?

Expand

Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

Learning Centre

View our range of webinars, and watch them on-demand now.

Webinars

Get your free licence today!

AZtecTimed Licence

Discover our collection of application notes now.

Applications

Featured products

Symmetry S2 is the only genuine all-in-one EBSD detector on the market, and is based on the revolutionary Symmetry detector, the world’s first EBSD detector to utilise advanced CMOS…

Symmetry S2^®

Find out more

AZtecWave combines the unique power of WDS to resolve X-ray peaks and quantify minor and trace elements with the speed and flexibility of EDS. EDS…

AZtecWave

Find out more

Collecting good quality data is only the beginning of any complete EBSD analysis. AZtecCrystal provides all the necessary tools to process and interrogate your EBSD data and to solve…