Providing leading-edge tools for SEM, TEM & FIB - Nanoanalysis

New: Webinar Advanced techniques in SEM & EDS for biological samples

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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

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AZtecFeature is the world-leading particle analysis solution for SEM. Using a combination of smart approaches, our latest release includes our FeatureExpress upgrade…

AZtecFeature

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AZtecWave combines the unique power of WDS to resolve X-ray peaks and quantify minor and trace elements with the speed and flexibility…

Wave Spectrometer

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Collecting good quality data is only the beginning of any complete EBSD analysis. AZtecCrystal provides all the necessary tools to process and interrogate your EBSD data and to solve…