New: Tutorial AZtecFeature: Speed in Every Aspect of Particle Analysis
26 May, 2022 | 9:30AM - 10 AM | 3:30PM - 4PM BST
Register nowOxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.
Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.