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Explore OI
Innovating material characterization and sample manipulation at the nanoscale

Symmetry EBSD Detector based on customised CMOS technology

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Webinar on Demand AZtecLive: a revolutionary approach to SEM-EDS analysis

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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.
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Read our application notes & watch our webinars on demand
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Upcoming Events

Aug
5
M&M 2018
Location:
Baltimore, USA
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NanoAnalysis
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Sep
9
IMC19
Location:
Sydney, Australia
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Sep
19
The Japan Institute of Metals and Materials
Location:
Chiba, Japan
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Sep
19
2018 Microscopy NanoAnalysis Forum
Location:
Hulunbeier, China
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Featured products

A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and performance,…

OmniProbe 400

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Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

Ultim Extreme

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Symmetry is the revolutionary all-in-one EBSD detector based on groundbreaking CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and…

Symmetry

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Latest News

Oxford Instruments enables Real-time Chemical Imaging by EDS

Oxford Instruments enables Real-time Chemical Imaging by EDS

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New EBSD detector "Symmetry" increases EBSD speed by an order of…

New EBSD detector "Symmetry" increases EBSD speed by an order of magnitude

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AZtecOneXT - a new standard of simplicity for EDS analysis.

Oxford Instruments has launched the AZtecOneXT system, an ideal solution…

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Next generation GSR system launched: AZtecGSR

Oxford Instruments, the World’s leading Gunshot Residue analysis system…

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