Providing leading-edge tools for SEM, TEM & FIB - Nanoanalysis

AZtecFlex
Anyone | Anywhere | Anytime

Giving you the full power of the AZtec suite

Learn more

New: Webinar
Optimising Battery Performance Through Materials Characterisation

November 10, 2021 | 15:00 GMT | 16:00 CET | 10:00 EST

Register now

Introducing:
Live Chemical Imaging

The only system enabling you to view
sample morphology & elemental
distribution, simultaneously &
continuously as you move around your
sample

Discover more

What can we help you with today?

Expand

Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

Learning Centre

Take a look at our blog library featuring an extensive range of blogs.

Blogs

View our range of webinars, and watch them on-demand now.

Webinars

Discover our collection of application notes now.

Applications

Featured products

AZtecFeature is the world-leading particle analysis solution for SEM. Using a combination of smart approaches, our latest release includes our FeatureExpress upgrade…

AZtecFeature

Find out more

AZtecWave combines the unique power of WDS to resolve X-ray peaks and quantify minor and trace elements with the speed and flexibility…

Wave Spectrometer

Find out more

Collecting good quality data is only the beginning of any complete EBSD analysis. AZtecCrystal provides all the necessary tools to process and interrogate your EBSD data and to solve…