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Webinar Characterisation of 3D Printed Materials in the Electron Microscope

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Innovating material characterization and sample manipulation at the nanoscale

Symmetry EBSD Detector based on customised CMOS technology

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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

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MIT.nano at MIT, Cambridge, MA, USA

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NanoScience, Asylum Research, Plasma Technology, Andor, NanoAnalysis

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Plasma Technology, NanoAnalysis

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Featured products

A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and performance,…

OmniProbe 400

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Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

Ultim Extreme

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Symmetry is the revolutionary all-in-one EBSD detector based on groundbreaking CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and…