Providing leading-edge tools for SEM, TEM & FIB - Nanoanalysis

NEW WEBINAR: Accurate and fast SEM-EDS analysis in any SEM

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INTRODUCING: Xplore

The Xplore EDS detector for routine analysis in the SEM

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New Whitepaper: EDS for Biology

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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

Application Note Library Webinars

We are celebrating as we are proud to announce that we won the Queen's Award for innovation 2019 for our Ultim Extreme product!

Sir Henry Aubrey-Fletcher, the Lord-Lieutenant of Buckinghamshire came to our office to present the certificate signed by the Queen and the Prime Minister.

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Featured products

A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and performance,…

OmniProbe 400

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Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

Ultim Extreme

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Symmetry is the revolutionary all-in-one EBSD detector based on groundbreaking CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and…