Providing leading-edge tools for SEM, TEM & FIB - Nanoanalysis

New: Webinar Characterising the nature & density of dislocations in materials using routine EBSD mapping

Feb 1, 2022 | 9AM - 10 AM | 4PM - 5PM GMT

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Introducing our NEW EBSD Website!

Providing knowledge & guidance for anyone
interested in EBSD

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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

Featured products

Live Chemical Imaging combined with Enhanced Sample Navigation delivers an instantaneous and moving analysis experience for all users. The new Live Chemical Imaging functionality…

AZtecLive Chemical Imaging & Enhanced Sample Navigation

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Symmetry S2 is the only genuine all-in-one EBSD detector on the market, and is based on the revolutionary Symmetry detector, the world’s first EBSD detector to utilise advanced CMOS…

Symmetry S2^®

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AZtecWave combines the unique power of WDS to resolve X-ray peaks and quantify minor and trace elements with the speed and flexibility of EDS. EDS…