Providing leading-edge tools for SEM, TEM & FIB - Nanoanalysis

Introducing: Xplore

The Xplore EDS detector for routine analysis in the SEM

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New Whitepaper: EDS for Biology

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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

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We are celebrating as we are proud to announce that we won the Queen's Award for innovation 2019 for our Ultim Extreme product!

Sir Henry Aubrey-Fletcher, the Lord-Lieutenant of Buckinghamshire came to our office to present the certificate signed by the Queen and the Prime Minister.

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