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Ultim® Max

Ultim Max EDS detectors use high-end technology to deliver unparalleled speed and sensitivity without compromising on accuracy or quality. This range of detectors combines the largest sensor sizes (up to 170mm2) with Extreme electronics to deliver remarkable performance.

Only Ultim Max has guaranteed performance at low (CKa and FKa) and high energy (MnKa) at the same highly productive count rate of 130,000cps for all sensor sizes. Performance is tested on a SEM before shipping and again at installation to ensure every Ultim Max delivers excellent results even under the most demanding analytical conditions (high count rates, low kV, insitu testing).

All Ultim Max detectors can be easily and rapidly inserted when needed and retracted when not in use thanks to an integrated motorised slide.


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Ultim Max is the next generation of Silicon Drift Detectors (SDD). Combining the largest sensor sizes with Extreme electronics to deliver unparalleled speed and sensitivity.

The large SDD sensors of Ultim Max allows up to 17x more data to be collected in the same time with no loss of accuracy. Whether you want to map larger areas, have better statistics in each data point, collect data much faster, or investigate the smallest nano-structures, Ultim Max is the ultimate solution for X-ray analysis in the SEM.

1. Sensor Area

2. Low Noise X-ray Detection

3. Bellows SEM Interface

4. Motorised Slide

5. Quantitative Analysis at >400,000CPS

6. X-ray Mapping at >1,000,000CPS

7. Size Really Matters

8. Sensor Independent Performance

9. Sample Damage

10. Sample Contamination

11 TruMap

12. Highlight Real Chemical Variation

13. Mapping Low Concentrations

14. Light Element Analysis

15. Low kV Analysis

Speed

The combination of Extreme electronics with the X4 pulse processor allows UltimMax to map samples at count rates of 1,500,000 cps and accurately quantify composition at 400,000 cps.

Sensitivity

Extreme electronics have very low noise. This allows accurate identification and characterisation of X-ray lines down to 72eV.

NanoAnalysis

The largest sensors with guaranteed low energy resolution mean Ultim Max is ideal for low kV analysis maximising capability for analysis at the nano-scale

Live Chemical Imaging

Ultim Max large sensors and performance at high throughput allows Live Chemical Imaging for the first time in electron microscopy.

Size Really Matters

Collect up to 17x the data in the same time

The large SDD sensors of Ultim Max allows up to 17x more data to be collected in the same time with no loss of accuracy. Whether you want to map larger areas, have better statistics in each data point, collect data much faster, or investigate the smallest nano-structures, Ultim Max is the ultimate solution for X-ray analysis in the SEM.

Video

Ultim Max: A Revolution in SDD Technology

The next generation range of SDD - Ultim Max combines the largest SDD sensors, with unique Extreme electronics.


Application Notes

Analysing a NAND Flash memory device using low kV EDS

The combination of X-Max Extreme with GeminiSEM 500 provides a uniquely convenient and powerful imaging and analysis tool for investigating the morphology and chemistry of nano-structures down to less than 10nm. Using the example of ferrocerium nano-particles and GaInAs quantum dots this capability is demonstrated in practice…

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AZtecLive In Depth: TruQ

This application note describes the unique approach and technology used in AZtecLive EDS systems to provide automatic real-time element identification and composition determination.

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AZtecLive In Depth: TruMap

This application note shows how TruMap displays in real-time the real variations of elements in a sample. It describes how minor element variations in a refractory oxide containing slag sample created during clean steel manufacture can be studied.

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