WDS (or WDX) stands for Wavelength Dispersive X-ray Spectrometry.
WDS is an analytical technique used to determine elemental composition by measuring characteristic X-rays generated by bombarding a solid with an electron beam. It is typically used to identify elements or quantitatively determine element concentrations at specific micron-sized points on a sample, or to map the distribution of elements across a sample surface.
The X-ray signal measured by WDS is the same as exploited by the more commonly used technique for elemental determination on a scanning electron microscope (SEM) - Energy Dispersive Spectrometry (EDS /EDX).
The spectral resolution of WDS is ~10x higher than EDS, enabling:
Wave is the only fully focusing Rowland circle geometry WD spectrometer offered for the SEM - giving the best spectral resolution
available. Combining a Wave spectrometer with an Ultim Max EDS detector brings together the advantages of both techniques – speed and sensitivity – offering unparalleled accuracy for element identification and compositional measurement on the SEM.
|EDS (Ultim Max)||WDS (Wave Spectrometer)|
|Spectral resolution (eV)||~50 – 200||~2 – 20|
|Detection limit (ppm)||~1000||<100 for many elements|
|Measurable element range||Be - Pu (Li on the Ultim Extreme)||Be - Pu|
Discover the five main reasons to add a Wave spectrometer to your SEM:Find out more on Wave
AZtecWave takes the complexity out of WDS analysis and combining it with EDS analysis. It delivers:
Discover more about AZtecWave and the five main reasons to upgrade an INCA Wave system:Learn More on AZtecWave 5 Reasons to Upgrade