Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventsContacteCommerce
Investors Careers
EDS
EDS for SEM and FIB >Ultim MaxUltim ExtremeAZtecLiveXploreAZtecLiveOneAZtecFeature
EDS for TEM >Ultim Max TEMAZtecTEMX-Max 100TLEX-Max TSRX-Max 80T
Detectors
Ultim MaxUltim ExtremeXplore
Software
AZtecGSRAZtecSteelAZtec LayerProbeAZtecSynergyAZtec3DINCAMineral
EBSD
Detectors
SymmetryC-SwiftC-Nano
Software
AZtecHKLAZtecSynergyAZtec3DPost-processing Software
Auto Webinar | 12 Mar
WDS
Detectors
Wave
Software
INCAEnergy+
Probes
Nanomanipulators
OmniProbe 400OmniProbe 200
Lift-out
OmniProbe cryo
Consumables
e-store
Applications
Advanced ManufacturingAgriculture & FoodAutomotive & Aerospace
Bio Imaging & Life ScienceChemical & CatalysisEnergy Generation & Storage
Forensics & EnvironmentGeology, Petrology & MiningMetals, Alloys, Composites & Ceramics
PharmaPolymersSemiconductors, Microelectronics & Data Storage
Library
Documents
Application Note LibraryProduct BrochuresCustomer Gallery
Webinars & Blog
WebinarsBlog
Auto Webinar | 12 Mar
Support
NanoAnalysis Support
Maintenance and supportConsultancy and application supportLiveAssist
Training
Training Overview
Consumables
OmniProbe ConsumablesAGAR (France)AGAR (Sweden)
News
Events
Contact
eCommerce
  1. Home
  2. Products
  3. AZtec
  4. AZtec3D

AZtec3D

AZtec3D
Video

AZtec3D combines simultaneous EDS and EBSD data acquisition & analysis with the automated milling capabilities of a FIB-SEM.

Full overview >

  • Superior data quality, combining Tru-I® and Tru-Q® in 3D

  • Optimized data acquisition through superfast EBSD and large area SDD
  • AZtec AuoLock Drift Correction
  • Simple setup for simultaneous EDS & EBSD data acquisition and FIB milling
  • Observe the EDS & EBSD map data slice by slice as it is collected


Request Pricing Add to quote list

AZtec3D combines simultaneous EDS and EBSD data acquisition & analysis with the automated milling capabilities of a FIB-SEM.

You may also be interested in...

Symmetry®
AZtecLive
Ultim® Max
X-MaxN

Related Applications

Nanomaterial Growth and CharacterisationAdditive ManufacturingStructural Materials and ComponentsEV TechnologiesBattery TechnologyMaterials for the Power Generation IndustryMaterial Composition and StructureFabrication and Characterisation of Light Emitting Devices

Upcoming events

Jul
1
MMC 2019
Location:
Manchester, UK
Businesses Attending:
NanoAnalysis, Asylum Research, Andor, Imaris
View Event >

Latest news

Introducing new range of SEM-EDS detector with Xplore

Oxford Instruments, the global leader in microanalysis systems, is proud…

Read full article >

© Oxford Instruments 2019

Website by Miramar Communications Ltd