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Wave Spectrometer

AZtecWave combines the unique power of WDS to resolve X-ray peaks and quantify minor and trace elements with the speed and flexibility of EDS. It uses the Wave WDS spectrometer which has the highest spectral resolution available for SEM to ensure more overlaps can be resolved and lower detection limits can be achieved. As the only EDS detector that gives the highest accuracy even at high count rates, Ultim Max combines with Wave to form the world’s highest performing microanalysis system.

  • Fully focussing Wave spectrometer with Rowland Circle geometry and curved crystals

  • Outstanding spectral resolution to fully resolve the most closely spaced X-ray lines

  • Higher peak to background ratios meaning detection limits lower than 100ppm

  • Motorised counter entrance slit optimises resolution and peak to background

  • Inclined geometry for fast, reproducible, and easy sample positioning


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AZtecWave_graph

AZtecWave uses the fully focussing Wave spectrometer with Rowland Circle geometry and curved crystals

  • Higher peak to background ratios meaning detection limits lower than 100ppm can be routinely achieved for many elements
  • Motorised counter entrance slit optimises resolution and peak to background for every X-ray line
  • Optimised for a wider range of energies using higher energy lines for more accurate quantitative results
  • • nique dual counters in series using Ar-CH4 for optimised light element and Xe for optimised high energy collection
  • Inclined geometry for fast, reproducible and easy sample positioning
  • Spectrometer miniview and mimic shows spectrometer position and setup at all times
  • Outstanding spectral resolution to fully resolve the most closely spaced X-ray lines meaning the most challenging problems are easily solved
    • SiKa <2eV
    • FeKa <25eV

Rowland Circle Geometry

Rowland_circle_Geometry

The Wave spectrometer uses a unique geometry for WDS on the SEM. For this geometry the sample, diffracting crystal and counter must be positioned on the Rowland Circle

  • The distance between sample and crystal and counter and crystal must be the same
  • Bent and ground crystals are used for best resolution
  • No requirement for fragile optic, slow mechanical alignment or transmission losses for higher energy lines
  • This unique geometry works at all energies and provides real WDS spectral resolution on the SEM
  • Optimised for all energies, meaning the optimum X-ray lines are always available for analysis
  • All common overlapping element lines separated including transition metal K lines
  • Lowest detection limits, in shorter collection times, with lower beam currents

                                                              WDS Hardware - Wave Spectrometer with W1 Clectronics
Geometry Fully focussing Rowland circle
Quantification Wave 500 - 0.17- 10.84 keV B (5) to PU (94)   |   Wave 700 – 0.07 – 10.84 keV Be (4) to PU (94) 
Spectral resolution  SiKα <2eV   |   FeKα <25eV
Detection Limit SiKα – 9ppm  |  FeKα – 15ppm
X-ray Counters  P10 (Ar-CH<sub>4</sub>) Flow and Xe Sealed
Motorised gate valve to microscope Standard

High quality reference standards for standardizing WDS and EDS quantitative analysis

  • Available in 37 standard (42 elements), and 55 standard (56 element) blocks
  • All standards are supplied with certificate of analysis
  • Standard blocks include a Faraday cup for accurate measurement of beam current
  • All standard blocks are manufactured for Oxford Instruments by Micro-Analysis Consultants Ltd

 

 

 

Standardisation
Standardisation

Max+ interface optimises EDS when using very high beam currents

Max Plus open New wheel colour key New beam current range max+

The Max+ interface has apertures of varying size used to reduce X-ray count rate into the EDS detector when working at very high beam currents

  • Optimum EDS performance always achieved so the analysis can be optimised for WDS detection
  • Large area EDS Ultim Max detectors with Max+ are compatible with all applications from low beam current EDS nano-analysis to combined EDS and WDS microanalysis
  • AZtec Wave always produces accurate answers 

Detailed Applications for WDS 

Wavelength Dispersive Spectroscopy (WDS) lends itself to applications requiring quantitative compositional results from solid samples, particularly where concentrations of minor and trace elements need to be accurately determined. Application examples exist in a wide range of sectors, including metallurgy, geology, electronics, semiconductors, forensics, and energy generation and storage. Combining WDS with EDS analysis, through AZtecWave, provides a versatile system for non-destructive, compositional analysis in the SEM.

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Structural Materials and ComponentsBattery TechnologyMaterials for the Power Generation IndustryForensic Soil Analysis and Other Trace AnalysisMaterial Composition and StructureFabrication and Characterisation of Light Emitting DevicesRock Core Analysis

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