Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
SustainabilityInvestorsCareersNewsEventsContact
Investors Careers
Products
SEM
Hardware
EDSUltim MaxUltim ExtremeXploreEBSDSymmetry S2C-NanoC-SwiftWDSWave
SEM
Software
EDSAZtecLiveAZtecLiveOneAZtecFeatureAZtec LayerProbeEBSDAZtecCrystalAZtecHKLAZtecSynergyWDSAZtecWave
FIB-SEM
Nanomanipulators
OmniProbeOmniProbe Cryo
Software
AZtec3DAZtecFeatureAZtec LayerProbe
TEM
Hardware
EDSUltim MaxXplore
Imaging
TEM Cameras
Software
AZtecTEM
Application Specific Software
Additive manufacturingAutomated mineralogyBattery materialsCorrelative microscopyGunshot residueNon-metallic inclusionsParticle AnalysisPharma applicationsTechnical cleanliness
Applications
Advanced ManufacturingAgriculture & FoodAutomotive & AerospaceBattery
Bio Imaging & Life ScienceChemical & CatalysisEnergy Generation & Storage
Forensics & EnvironmentGeology, Petrology & MiningMetals, Alloys, Composites & Ceramics
PharmaPolymersSemiconductors, Microelectronics & Data Storage
Learning
Literature
Application Note LibraryAztecTimed: Free LicenseBlogCustomer galleryProduct brochuresTestimonials
Watch
Tips & Tricks Videos Tutorial & Demo VideosVirtual HubWebinars
Support
NanoAnalysis Support
Maintenance and supportConsultancy and application supportLiveAssistContact us
Training
Training Overview
Consumables
AGAR (France)AGAR (Sweden)
Shop
UKEuropeUS & CanadaAsiaJapanChina
News
Events
Contact
eCommerce
  1. Home
  2. Products

Products


Product Groups (None Selected)
AZtec

AZtec

Select
Details
EBSD

EBSD

  • EBSD - Electron Backscatter Diffraction - analysis is a very powerful tool for microstructural characterisation
Select
Details
EDS

EDS

  • Energy Dispersive Spectroscopy (EDS) Analysis provides elemental and chemical analysis of a sample inside the SEM, TEM or FIB.
Select
Details
Nanomanipulation

Nanomanipulation

  • OmniProbe nanomanipulators for FIB and SEM have led the industry since 1995
Select
Details
OmniProbe

OmniProbe

Select
Details
Ultim Detectors

Ultim Detectors

Select
Details
WDS

WDS

  • Excellent peak separation
  • Accurate trace element analysis
  • Optimised element detection
Select
Details
Semicon

Semicon

  • Excellent peak separation
  • Accurate trace element analysis
  • Optimised element detection
Select
Details
Nanomanipulators

Nanomanipulators

Select
Details
All Product Groups
Applications
Businesses

Loading...

© Oxford Instruments 2021

Website by Miramar Communications Ltd