AZtecFeature

Fast, Accurate & Smart Particle Analysis: AZtecFeature is as automated as possible...as flexible as needed

Fully Integrated

As AZtecFeature is fully integrated with the rest of the AZtec Suite; adding chemical data could not be easier...

• Acquire an EDS spectrum for each particle automatically
• Use existing settings in the AZtec user profile for spectrum processing
• Generate the right result using Tru-Q^® algorithms
• Start building a classification scheme at the click of a button

Easily move from single field to large area analysis 

Going from single field analysis to acquiring data over a large area of a specimen or even several specimens is easy:

• A wizard guides users through the setting up of areas and samples
• Areas can be stored and recalled for later use
• For each sample, up to 200,000 particles over thousands of fields of view can be analysed automatically
• The system fully automates the stage movement, image acquisition and EDS acquisition and stitches the acquired data together into a single large area. Individual fields are automatically shown in a montaged view during acquisition
• See the ‘big picture’ and zoom into details during acquisition
• Relocate to any field and acquire data for further analysis
• Automatic system pause when a blown filament is detected (microscope dependent)

Reporting

As soon as data from a particle is acquired, it is added to a customisable list displaying morphological and compositional measurements and particle classifications.

• Interact with and interrogate the tabulated results while data acquisition is still in progress
• Visualise data in the form of histograms and summary reports can be generated directly into Microsoft Word
• For further, more detailed analysis and plotting options, comprehensive data export into Microsoft Excel is available

Particle Analysis Applications: Informed decisions based on morphology and chemistry

Unlike light-optical methods, AZtecFeature classifies particles and features not only by size and shape but also by their chemical composition, including any combination of these parameters.

The extra dimension provided by compositional analysis creates certainty as to the origin and impact of identified particles on materials properties or an industrial process. It opens up applications in R&D and industrial process control such as:

• Technical cleanliness – identify of the source of contaminants in precision manufacturing processes in the electronics, semiconductor and automotive industries
• Engine wear analysis – monitor combustion engine health by analysing particles found in engine oil filters
• Steel cleanliness – analyse the nature and origin of non-metallic inclusions in metals and steels
• Forensic analysis – detect and analyse trace evidence material in crime science and industrial forensics
• Geology and mineralogy – identify and measure phase compositions and textures in geological samples
• Air filter analysis – monitor air quality and pollution by analysing particles in air filters
• Asbestos - identify fibres in a sample by morphological analysis and confirm the type of asbestos present by chemistry
• ... & many more...

Rare particle detection

AZtecFeature is ideally suited to rapidly find rare features or particles of interest, solving so-called ‘needle in a haystack’ problems.

By processing the electron image, candidate features can be identified rapidly and their chemistry confirmed by EDS. This technique is widely used in crime forensics to identify gunshot residue and for identifying precious metals in ore samples. It can cut the analysis time from hours to minutes and free up the operator’s time.

Big Data - Extract Feature Data from Existing Datasets

AZtec offers the automated acquisition of large area X-ray maps which are used to reveal nanoscale features distributed over large areas. AZtecFeature is used to extract X-ray data from large area maps comprising tens of gigabytes of data. By intelligently combining the information from electron images and X-ray mapping data, AZtecFeature is an effective data mining tool to analyse large sets of analytical data.

• Search large area mapping data for particular phases or inclusions
• Perform morphological measurements and classify the features found in these datasets
• Quantify grain sizes and shapes for compositionally inhomogeneous phases
• Work on previously acquired mapping data

Application Specific Modules

Automated mineralogy - AZtecMineral

The most advanced and cost-effective automated mineralogy system on the market.

• Automatically analyse grain mounts and polished rock sections
• Calculate mineral liberation, modal mineralogy and phase associations
• Directly report phase compositions and compare to assay results
• Use dedicated setups for a range of different ore types

Find out more here: AZtecMineral

Gunshot residue analysis - AZtecGSR

The GSR module adds dedicated setups for crime forensics and gunshot residue analysis. It enables particle classification and reporting according to ASTM 1588-20.

• Classification for all ammunition types
• Reliable identification of gunshot residue particles
• Standard samples for system calibration and optimum repeatability

Find out more here: AZtecGSR

Non-Metallic Inclusions in Steel - AZtecSteel

Analyse inclusions in steels, tyre cords and powder metallurgy...

• Determination of steel cleanliness according to a range of international standards
• Identification and classification of complex inclusions, stringers and clusters
• Comprehensive, automated report generation including statistical data on inclusion types, ternary phase diagrams and plots etc.

Find out more here: AZtecSteel 

Cleanliness in Battery Manufacture - AztecBattery 

Analyse the powders used in the manufacture of Li-ion batteries for the presence of contaminants

• Identify the contaminants by composition and morphology to aid in the process of determining sources and remedial actions
• Easily deployable across multiple sites – ensure consistent cleanliness standards throughout supply chains
• Comprehensive, automated report generation including statistical data on inclusion types, ternary phase diagrams and plots etc.

Find out more here: AZtecBattery 

Technical Cleanliness in Automotive Manufacture - AZtecClean

Analyse technical cleanliness samples in automotive manufacture and report results to ISO16232 or VDA 19.

• Identify particles by composition and morphology to aid in the process of determining sources and remedial actions
• Easily deployable across multiple sites – ensure consistent cleanliness standards throughout supply chains
• Report to industry relevant standards including ISO16232 and VDA19 and calculate component cleanliness codes in the software

Find out more here: AZtecClean

Quality Control for Additive Manufacturing Powders - AZtecAM

Analyse metal powders before and after use to maintain quality in your additive manufacturing.

• Identify contaminants so that sources can be identified and fixed

• Monitor previously used powders to determine if they can be recycled again
• Combine with EBSD with Symmetry S2 to check the quality of finished components

Find out more here: AZtecAM

Advanced characterisation

The integration of AZtecFeature with the other modules in the AZtec nanoanalysis suite enables seamless transitions between different techniques and sensors.

For example, if a particle or grain of specific interest is identified during an automated run, it can be relocated and an X-ray or EBSD map acquired in seconds. The advanced AZtec TruMap and TruPhase functionality correct for overlaps and background variations in EDS data and identify phases unambiguously by combining EBSD and EDS data. Alternatively, WDS can be used to determine trace element concentrations or to resolve complex overlaps. 

Integration enables:

• Automated pre-screening of samples with AZtecFeature
• Subsequent re-analysis of specific features using alternative techniques
• Combination of Feature analysis with:
  • X-ray mapping
  • TruMap - removes background and peak overlaps on the fly
• TruMap - removes background and peak overlaps on the fly
• Detailed spectrum analysis with interactive overlaps and element profiles
• Film thickness (LayerProbe)
• EBSD analysis
• TruPhase - combines X-ray and EBSD for unambiguous phase identification
• WDS quantitative analysis

A range of Silicon Drift Detectors (SDD) for particle analysis applications

AZtecFeature works best with Oxford Instruments’ Ultim Max SDDs which come in a range of sizes to suit budget and application – 40 mm²  for basic microanalysis up to an astounding 170 mm²  for advanced nanoanalysis. 

• A range of silicon drift detector sizes
• From 40 mm² to 170 mm²
• The same geometry inside the SEM means count rate increases in proportion to sensor size

All Ultim Max detectors provide:

• The best low energy performance – all detectors clearly resolve Be
• The same excellent resolution, guaranteed on your microscope
• The same physical geometry, so existing systems can be easily upgraded

Using a larger sensor means:

• Usable count rates at lower currents
• Maximising imaging performance and accuracy enabling the detection of sub-micron particles and nanoparticles
• Significantly higher count rates at the same beam current
• Shorter acquisition times and better statistical confidence
• Practical analysis with small beam diameters, maximising spatial resolution

For applications that do not demand the full Ultim Max performance, Xplore is available. It is a fully quantitative 10 mm² SDD with excellent performance at low and high count rates.

Multiple detector systems

When used in automated process control, adding one or more extra detectors can significantly enhance the sample throughput.

For challenging applications, where very small particles or particles on beam sensitive substrates are being analysed, traditional, high energy (e.g. 20kV) analysis may not be an option. In such cases multiple detectors can provide an effective solution to enhance the collection efficiency so that particle detection can progress rapidly. For samples where particle size varies significantly, shadowing of smaller particles by larger particles can be a significant issue when only one detector is used. Having at least two detectors mounted on opposing ports can overcome these shadowing effects.

• Up to four Ultim Max can run in parallel on one microscope to create a system with a total active area of 680 mm²
• Multiple detectors enable the analysis of:
  • Nanoscale particles at low kV where the highest solid angle is required
  • Particles on beam sensitive substrates (e.g. filters, resins etc)
  • Samples of particles with varying size where shadowing of smaller particles is an issue (see the image at the top of this page).

A multiple detector system not only achieves faster sample throughput, it also reduces the effect of shadowing.