Part of the Oxford Instruments Group
Ultim Max is the next generation of Silicon Drift Detectors (SDD) utilising our Extreme electronics to generate maximised sensitivity with increased throughput. This powers AZtecTEM, the market-leading software that delivers unparalleled elemental characterisation performance in the TEM.
This document gives an introduction to EDS applications in the Transmission Electron Microscope (TEM).
This brochure shows why AZtecTEM is the most powerful solution for EDS on the TEM.
Simultaneous acquisition of EDS and EELS is a powerful tool for materials analysis
Development and testing of semiconductor devices requires extensive knowledge of local structure and elemental composition.
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