AZtecWave

AZtecWave combines the unique power of WDS to resolve X-ray peaks and quantify minor and trace elements with the speed and flexibility of EDS. EDS and WDS Wave Spectrometer operation is fully integrated into the AZtec software, guaranteeing maximum accessibility to users with all levels of expertise and Tru-Q^® processing technology for the most accurate results. When microanalysis is at its most challenging, AZtecWave provides accurate answers, fast.

Enhanced clarity of element identification and composition
Detection and measurement levels of trace elements down to tens of ppm
Accurate composition determination of all elements at all concentration levels
Fully integrated workflows designed to optimise combined EDS and WDS acquisition in the AZtec platform
Real-time input from EDS and SEM to optimises WDS set-up guaranteeing excellent results

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New levels of accuracy and sensitivity

Enhance clarity of element identification and composition, where element peaks are not clearly resolved in the EDS spectrum
Detect and measure levels of trace elements down to tens of ppm
Determine accurate composition of all elements at all concentration levels
Measure major elements using EDS and heavily overlapped or trace elements by WDS
Solve characterisation challenges in metallurgy, electronics, mineralogy/geology, ceramics, forensics and nuclear power generation

Accessible to all users

Fully integrated workflows designed to optimise combined EDS and WDS acquisition in the AZtec platform
New technology uses real-time input from EDS and the SEM to optimise WDS set-up, and gives feedback to the user before the acquisition is started - guaranteeing excellent results in the shortest collection times, and for all levels of user expertise
Unique 3-way control to optimise beam current, count time and precision before quantitative analysis
Review and assess potential WDS scan quality with the selected settings before starting acquisition
Flexible, manual control for experienced users
The inbuilt technology uses EDS and SEM system information to inform automatic selection of:

For quantitative combined EDS-WDS analysis:

Count time
Line series and X-ray line
Diffracting crystal
Background positions
EDS acquisition parameters
EDS detector position

For qualitative WDS spectrum scanning:

Crystal(s)
Slit size(s)
Slit positions(s)
Dwell Time

Accurate for all elements

The Wave WDS spectrometer allows AZtecWave to deliver true electron microprobe performance on a SEM

Optimised for all energies, meaning the optimum X-ray lines are always available for analysis
All common overlapping element lines separated including transition metal K lines
Lowest detection limits, in shorter collection times, with lower beam currents

Integrates seamlessly with the AZtecLive EDS software and technology

Tru-Q technology provides electron-microprobe level quantitative accuracy at EDS count rates up to 400,000cps

Composition of a stainless steel determined by a combination of EDS and WDS in AZtecWave.

WDS Scan of the Co Kα peaks present in a superalloy with 0.1 wt% Co.

Setup Spectrometer

Step by step workflow to guide you through Wave spectrometer setup and performance check

Designed for inexperienced users
Ensures safe operation
Provides rapid system set-up
Guarantees optimum performance

Generate performance test report where required (e.g. for accredited facilities)

Qualitative Spectrum Scanning

A sequence of steps for straightforward setup and acquisition of WDS spectrum scans using the Wave spectrometer

A scan range can simply be entered by using a swipe tool, or selecting a candidate element line
Based on the selected energy range, and using inbuilt technology, crystal, slit size, and slit position are automatically optimised
A theoretical scan is shown prior to acquisition, enabling settings to be assessed and adjusted before pressing start
Dwell times can be set between 0.005 and 50 s allowing major through to trace elements to be identified in scans
Both WDS scans and EDS spectra can be reviewed and compared

Quantitative Analysis

Dedicated workflow for combined EDS and WDS acquisition and quantitative analysis

Uses EDS for sample analysis location and to automatically optimise all EDS and WDS collection parameters
‘Acquisition timeline’ estimates WDS acquisition time during acquisition set-up and shows status of the Wave spectrometer during acquisition
Advanced options include adding additional WDS acquisition or an existing EDS spectrum to an analysis
Dedicated ‘Calculation Composition’ step for viewing and checking quantitative results from single or multiple acquisitions
Synthesized WDS spectra transform EDS spectral data into high resolution, high peak to background space for checking overlaps, and acquisition energy for X-ray lines and backgrounds

Standardisation

Guided workflow to ensure system is optimally calibrated using standard materials for accurate composition determination

Optimised acquisition conditions calculated automatically
Oxford Instruments 42 and 56 element standard block composition and map are pre-loaded for easy navigation and speedy set-up
Association of beam current measurement with EDS count rate for calculation of un-normalised combined EDS-WDS results

AZtecWave
Setup spectrometer	✔
Qualitative spectrum scanning	✔
Quantitative analysis	✔
Image registration and navigation	✔
Standardisation	✔
Compare WDS scans and EDS spectra	✔
Guided sample exchange and spectrometer shutdown	✔
WDS spectrum simulation	✔
WDS acquisition timeline	✔
EDS informed automatic acquisition set-up	✔
3 way control of beam current/acquisition time/precision	✔
WDS X-ray Mapping	INCA Energy+ (optional)

Detailed Applications for WDS

Wavelength Dispersive Spectroscopy (WDS) lends itself to applications requiring quantitative compositional results from solid samples, particularly where concentrations of minor and trace elements need to be accurately determined. Application examples exist in a wide range of sectors, including metallurgy, geology, electronics, semiconductors, forensics, and energy generation and storage. Combining WDS with EDS analysis, through AZtecWave, provides a versatile system for non-destructive, compositional analysis in the SEM.

Discover detailed applications examples

Videos

Introduction to Wavelength Dispersive Spectrometry

This tutorial explains the principles of Wavelength Dispersive Spectrometry (WDS / WDX) and how a WD spectrometer with Rowland Circle geometry works on an SEM in combination with EDS.

Watch this video & learn:
✅ The principles of Wavelength Dispersive Spectrometry
✅ How the Oxford Instruments Wave spectrometer works and how it enhances a SEM-EDS system
✅ When you might want to conduct WDS analysis and typical applications

Enhanced Compositional Mapping on the SEM Through Combined EDS-WDS Mapping in AZtecWave

This video presents how elemental mapping using a fully focussing Rowland circle, wavelength dispersive spectrometer (WDS / WDX) can enhance compositional mapping with Energy Dispersive Spectrometry (EDS / EDX), by enabling accurate mapping of elements present in trace concentrations or impacted by X-ray peak overlaps in the EDS spectrum.

This is illustrated with a WDS-EDS dataset collected from a steel sample containing multiphase inclusions, which was acquired using functionality that is coming soon to the AZtecWave software for combined WDS and EDS mapping.

Resolve Overlaps & identify trace elements using WDS Scan in AZtecWave

WDS Scan is a new workflow in AZtecWave that enables the positive identification of elements affected by peak overlaps in the EDS spectrum, and/or present in trace concentrations (Less than 0.1 wt%).

Several different sample types will be presented as examples, including minerals, metals, and solder used in electronics. In addition, the tutorial will include demonstrations of how to; (1) acquire WDS scans using the different setup tools available, (2) identify the element lines present, and (3) compare multiple WDS scans and EDS spectra.

AZtecWave - extend the capability of your SEM

Discover how AZtecWave is the perfect solution to accurately and quickly detect all elements for challenging issues in the SEM. Discover how AZtecWave can help you achieve high quality results.

AZtecWave - WDS Scan

Discover the latest functionality for the AZtecWave WDS Scan, which powers the only WDS spectrometer with true electron-microprobe resolution and performance on the SEM. See how you can take data from SEM-EDS to a new level of certainty - by showing all peak overlaps fully resolved and accurately measuring all elements, including those present at the minor or trace level.

Resolving X-ray line overlaps using WDS & AZtecWave

Both EDS and WDS are techniques that use X-rays, generated when an electron beam interacts with a material, to determine the elemental composition. Since EDS can collect all X-ray energies at the same time, compared to WDS which collects one X-ray energy (i.e., element-line) at a time, EDS is faster and therefore more commonly used for SEM-based compositional analysis. However, WDS does bring some significant advantages over EDS.

A Practical Introduction to Wavelength Dispersive Spectrometry (WDS) and AZtecWave

This tutorial will give a practical introduction to WDS and AZtecWave - our new software for combined SEM-based EDS-WDS analysis.

AZtecWave: WDS detection and EDS speed with AZtec accuracy and accessibility

AztecWave accelerates your time to results, helping you achieve more in less time, with unparalleled accuracy and certainty. In this tutorial, discover how AZtecWave provides WDS detection and EDS speed with accuracy and accessibility.