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The C-Nano+ is an outstanding entry-level EBSD detector. The innovative technology that has helped the Symmetry S3 detector make such an impact is  implemented in the C-Nano+, delivering class-leading performance at an entry level. The C-Nano+ is suited to characterising all types of samples, but its high pixel resolution makes it ideal for detailed strain analyses as well as for routine work on complex and challenging materials.

  • Full 1244 x 1024 pixel resolution patterns – ideal for high resolution EBSD

  • Class-leading acquisition speed of > 600 pps

  • Fibre optics delivering extreme sensitivity for low energy and low current analyses

  • Distortion free images

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The C-Nano+ is an EBSD detector that is designed for all types of materials and applications. Utilising a customised CMOS sensor, the C-Nano+ delivers a top acquisition speed exceeding 600 pps with exceptional 312 x 256 pixel resolution patterns: this makes it about 5-6 times faster than comparable CCD-based detectors, using patterns with at least 4 times as many pixels. The result is a performance that you can trust, with excellent data quality on even the most challenging of materials.

The lens-free fibre-optics design within the C-Nano+ ensures superb sensitivity as well as sub-pixel distortion levels, making this an ideal detector for detailed strain analyses for which excellent, high definition patterns are a necessity. The maximum analysis speeds can be achieved using very low beam currents (under 3 nA), while the full resolution mode delivers a maximum sensitivity of 900 pps / nA, enabling detailed and successful analyses of beam-sensitive and nanocrystalline materials.

The C-Nano+ also benefits from the multiple design features unique to the whole Oxford Instruments CMOS detector range, including the proximity sensor that will help to avoid unwanted and expensive collisions before they occur. This is a detector that you can trust to deliver the results you need, every time.

The C-Nano+ detector is your high-performance entry into CMOS technology:

  • Guaranteed indexing speeds of 600 pps using only 3 nA beam current
  • 312 x 256 pixel pattern resolution at maximum speed – 4 times more pixels than a sensitive CCD detector at comparable speeds
  • Full megapixel resolution patterns (1244 x 1024 pixels) – ideal for strain analyses using high resolution EBSD
  • Guaranteed sub-pixel distortion, ensuring an angular precision better than 0.05°
  • Extreme sensitivity delivered by fibre-optics and an optimised phosphor screen, ensuring high quality patterns at low doses and low beam energies – resulting in maximum spatial resolution
  • Seamless EDS integration even at the highest speeds
  • Bellows SEM interface, maintaining the microscope’s vacuum integrity
  • Unique proximity sensor – detects potential collisions before they happen and automatically moves the detector to a safe position
  • Simple and intuitive detector settings, ensuring optimum results every time
  • Five integrated forescatter detectors (optional), providing full colour complementary channelling contrast and atomic number contrast images.

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C+ Series EBSD Detectors

The C+ series EBSD detectors, the C-Nano+ and the C- Swift+, are 2nd generation entry-level detectors designed for every type of EBSD application.

Symmetry S3

Symmetry S3 is a 3rd generation detector based on the advanced CMOS technology and unique design features that have made Symmetry the market’s leading EBSD detector.


This 16 page brochure illustrates why AZtec is the leading EBSD analysis platform on the market. Covers both hardware and software.

EBSD Explained

EBSD Explained is a 24 page tutorial that not only gives newcomers a solid foundation in the underlining science of the subject, but also shows how the theory is applied in practice to get reliable and accurate EBSD results.


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