COMING SOON | 21 JUNE 2018

Semiconductor failure analysis solutions 

Semiconductor failure analysis requires painstaking detective work to understand the source of failures so that they can be removed from volume production.  Discover how Oxford Instruments solutions can enable you to overcome these and other challenges.

A technology breakthrough: why CMOS-based detectors are changing the way we use EBSD

Introducing the Oxford Instruments CMOS-based EBSD detector range and discussing the technological benefits of CMOS sensors compared to traditional charge coupled device (CCD) devices.

AZtecLive: A revolutionary approach to SEM-EDS analysis

Discover how AZtecLive can radically change the way you approach sample investigation in the electron microscope.  Using different application examples and demonstrating results achieved in a fraction of the time.

High speed particle analysis: recent advances & new applications

The automated acquisition and classification of linked morphology and chemistry data from particles, grains, inclusions or other features is vital in many fields. Discover why AZtecFeature is the fastest and most accurate feature analysis tool available.