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Learn how to characterise Li-based phases for next generation battery development using Scanning Electron Microscopy (SEM) combined with Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD). In the webinar, learn how you can monitor materials quality throughout the production process and investigate failure mechanisms and develop solutions.
Discover the challenges of biological applications of Energy Dispersive X-Ray Spectroscopy (EDS), recognising issues related to specimen preparation and providing information on sample preparation methods and imaging conditions to maximise results, as well as covering the use of EDS in identification and imaging of cell ultrastructure.
This webinar will discuss the extent of the capabilities of the Table-Top Scanning Electron Microscope (TTM) combined with Energy Dispersive X-ray Spectroscopy (EDS) for quick, easy and repeatable compositional analysis and materials characterisation.
Learn how scanning electron microscopy (SEM) can help characterise airborne particulate matter and how this information is used and interpreted.
Learn how the combination of EDS & EBSD on an electron microscope can be applied to the characterisation of materials ensuring manufacturing and product reliablity.
Learn the complementary potential of analytical scanning electron microscopy (SEM) for fast and precise elemental characterisation of ultrastructural features in biological samples, without the need for specific labelling.
This webinar will discuss the effect of detector design on solid angle, and how these designs can be optimised to maximise solid angle for a number of different applications in the TEM. We will focus on the key characterisation abilities of new detectors for in situ experiments.
Find out how electron microscopy can be combined with light and scanning-probe microscopy analyses on the identical positions in order to investigate structure-property relationships in optoelectronic devices and how all parts of a Li-ion battery can be characterised.
Examine the role of electron microscopy as a powerful tool within the 3D printing process, See how to control the cleanliness of powder feedstock using automated particle classification with EDS as well as ensuring the quality of finished components using microstructural characterisation with EBSD.
Semiconductor failure analysis requires painstaking detective work to understand the source of failures so that they can be removed from volume production. Discover how Oxford Instruments solutions can enable you to overcome these and other challenges.
Introducing the Oxford Instruments CMOS-based EBSD detector range and discussing the technological benefits of CMOS sensors compared to traditional charge coupled device (CCD) devices.
Discover how AZtecLive can radically change the way you approach sample investigation in the electron microscope. Using different application examples and demonstrating results achieved in a fraction of the time.
The automated acquisition and classification of linked morphology and chemistry data from particles, grains, inclusions or other features is vital in many fields. Discover why AZtecFeature is the fastest and most accurate feature analysis tool available.
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