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Learning Zone

Welcome to our Webinar library! We've hosted numerous webinars covering multiple application areas as well as product releases. We'd love to hear if there are certain topics you want us to cover in the future.

Future webinar suggestions
Understanding temperature induced microstructural changes in additively manufactured alloys

Learn how to overcome challenges of in-situ heating experiments for EBSD & how the heating-rate effects the temperature recrystallisation mechanism. Explore how fast & sensitive CMOS EBSD allows the effect of cooling rates on nucleation of the room temperature phase to be measured.


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Gunshot Residue Analysis with the AZtecGSR

This webinar will cover the use of the SEM with AZtecGSR for Gunshot Residue Analysis.  This technique is fast and accurate: it gives reproducible results to ASTM E1588 - 10e1. AZtecGSR combines ease of use through its guided workflow, with the ultimate accuracy using the latest Ultim Max detectors and Tru-Q algorithms.

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Powering the future through nano-characterisation

Learn how to characterise Li-based phases for next generation battery development using Scanning Electron Microscopy (SEM) combined with Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD). In the webinar, learn how you can monitor materials quality throughout the production process and investigate failure mechanisms and develop solutions.

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Bringing EDS to life: sample considerations for biological element analysis

Discover the challenges of biological applications of Energy Dispersive X-Ray Spectroscopy (EDS), recognising issues related to specimen preparation and providing information on sample preparation methods and imaging conditions to maximise results, as well as covering the use of EDS in identification and imaging of cell ultrastructure.

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Table-Top Electron Microscopy as an Analytical Tool for Materials Characterisation

This webinar will discuss the extent of the capabilities of the Table-Top Scanning Electron Microscope (TTM) combined with Energy Dispersive X-ray Spectroscopy (EDS) for quick, easy and repeatable compositional analysis and materials characterisation.

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Characterising and monitoring materials developed for use in extreme environments

Learn how the combination of EDS & EBSD on an electron microscope can be applied to the characterisation of materials ensuring manufacturing and product reliablity.

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Rapid Elemental Characterisation of Biological Samples

Learn the complementary potential of analytical scanning electron microscopy (SEM) for fast and precise elemental characterisation of ultrastructural features in biological samples, without the need for specific labelling. 

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Nano-characterisation: driving progress in energy generation & storage

Find out how electron microscopy can be combined with light and scanning-probe microscopy analyses on the identical positions in order to investigate structure-property relationships in optoelectronic devices and how all parts of a Li-ion battery can be characterised.

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Characterisation of 3D Printed Materials in the Electron Microscope

Examine the role of electron microscopy as a powerful tool within the 3D printing process, See how to control the cleanliness of powder feedstock using automated particle classification with EDS as well as ensuring the quality of finished components using microstructural characterisation with EBSD.

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Semiconductor failure analysis solutions 

Semiconductor failure analysis requires painstaking detective work to understand the source of failures so that they can be removed from volume production. Discover how Oxford Instruments solutions can enable you to overcome these and other challenges.

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A technology breakthrough: why CMOS-based detectors are changing the way we use EBSD

Introducing the Oxford Instruments CMOS-based EBSD detector range and discussing the technological benefits of CMOS sensors compared to traditional charge coupled device (CCD) devices.

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AZtecLive: A revolutionary approach to SEM-EDS analysis

Discover how AZtecLive can radically change the way you approach sample investigation in the electron microscope.  Using different application examples and demonstrating results achieved in a fraction of the time.

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The latest developments in EDS hardware and software technology for the TEM

This webinar will discuss the effect of detector design on solid angle, and how these designs can be optimised to maximise solid angle for a number of different applications in the TEM. We will focus on the key characterisation abilities of new detectors for in situ experiments.

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High speed particle analysis: recent advances & new applications

The automated acquisition and classification of linked morphology and chemistry data from particles, grains, inclusions or other features is vital in many fields. Discover why AZtecFeature is the fastest and most accurate feature analysis tool available.

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Airborne particles: where they're from and how they affect us

Learn how scanning electron microscopy (SEM) can help characterise airborne particulate matter and how this information is used and interpreted.

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