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Oxford Instruments’ unique new screen for Transmission Kikuchi Diffraction (TKD), combined with our industry leading CMOS EBSD detectors, provides the most sensitive TKD solution on the market.
The improved sensitivity of NA-TKD enables:
NA-TKD is the TKD technique that positions an angled screen in a geometry close to the axis of the transmitted beam, providing all the advantages of off-axis TKD with improved sensitivity.
The NA-TKD screen is an angled screen, optimised for TKD analysis and compatible with all our CMOS EBSD detectors.
The NA-TKD screen comes as part of a kit that also provides an optimised sample holder and all the equipment needed for changing your screen.
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