Products
FIB-SEM
Nanomanipulators
OmniProbeOmniProbe CryoSoftware
AZtec3DAZtecFeatureAZtec LayerProbeTEM
Hardware
EDSUltim MaxXplore for TEMImaging
TEM CamerasSoftware
AZtecTEM
Nanoparticles are a key ingredient in many industrialised products. Characterising their key parameters (size, composition…etc) is essential to understand their behaviour, performance and risk to the environment and human health. In this application note, discover how to analyse nanoparticles in the SEM using low kV EDS and understand what key aspects are needed to have a successful analysis (sample preparation, windowless EDS detector for low kV analysis, drift correction…etc). As an example, the analysis of titanium dioxide and zinc oxide nanoparticles, widely used in cosmetics and food products, is presented.
By downloading this application note, you will learn: