Unlocking the secrets of nanoscale structures in fault rocks

Conventional analyses of fault rocks using electron backscatter diffraction (EBSD) or transmission Kikuchi diffraction (TKD) can be very challenging, due to the fine grain size, the high dislocation densities and the potential presence of amorphous material. In this application note newly-developed EBSD pattern matching methods in AZtecCrystal MapSweeper are used to characterise complex fault rock microstructures from a sample produced during seismic faulting in New Zealand. The results show how new insights into the faulting processes can be obtained from these high resolution crystallographic analyses.

By downloading this application note, you will learn how:

• How EBSD and TKD can be used to characterise fault rock microstructures
• How pattern matching methods enable more robust measurement of highly deformed structures
• The importance of crystal plastic deformation and mechanical amorphisation in fault rock development