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Evaluating parent grain reconstruction in Titanium using high temperature in-situ EBSD

Parent grain reconstruction is a process that allows researchers to reconstruct high temperature microstructures from room temperature EBSD analyses, for materials that have undergone displacive phase transformations. In this application note a commercially pure Titanium sample is analysed using in-situ EBSD at high temperature (>900 °C - in the beta-Ti stability field), utilising a new phosphor screen with an in-built infra-red filter. The sample was cooled and then reanalysed at room temperature, after the beta-Ti had transformed to alpha-Ti. The parent grain reconstruction tool in AZtecCrystal was then used to reconstruct the parent beta-Ti microstructure, and the results compared to the as-measured data.

By downloading this application note, you will learn how:

  • Fast, high-quality EBSD analyses at high temperatures are possible
  • Parent microstructures can be effectively reconstructed using AZtecCrystal
  • The reconstructed beta-Ti microstructure agrees closely with the as-measured high temperature microstructure
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