Rapid Electronics Inspection with Unity
Understanding whether or not an electronic device meets manufacturing specifications requires information from a combination of sources – backscattered electron imaging that show the structure and compositional, x-ray images that show the distribution of elements. In this app note we show how BEX imaging with Unity makes it possible for this information to be gathered exceptionally quickly whilst navigating around samples and across large areas – as well as allowing for very high quality imaging outputs to be easily collected.
By downloading this application note, you will learn:
- How BEX imaging with Unity combines BSE and compositional X-rays
- How electronic devices can be rapidly imaged on a small and large scale
- That BEX can produce high quality image outputs for reporting
Get my copy!
Part of the Oxford Instruments Group
