Transmission Kikuchi diffraction (TKD) is a relatively recent development in EBSD that allows high-resolution analysis of electron transparent samples. Most applications in the literature have used TKD for targeted measurements of relatively small areas, on samples where conventional EBSD struggles to deliver the required resolution. These samples are typically nanocrystalline metals and alloys, although increasingly the technique is also being used to characterise highly deformed samples, where the high dislocation density makes characterisation using conventional EBSD very challenging.
In this application note, we look at a range of sample types, including severely deformed Al-alloys and steels as well as an electrodeposited, nanocrystalline Ni. The TKD analysis results show how the sensitivity and speed of Symmetry can provide significant benefits in these high-end applications.