CMOS-EBSD Detector Range
Discover the market leading range of EBSD detectors based on CMOS technology: a world first in innovative technology.
C-Swift is the newest member of our CMOS detector family designed for routine materials analysis and high throughput sample characterisation.
C-Swift benefits from many of the features that have made Symmetry S2 such a groundbreaking EBSD detector including, of course, a customised CMOS sensor designed for EBSD.
Guaranteed indexing speeds of 1000 pps
622 x 512 pixel EBSPs at 250 pps
Fibre optics delivering extreme sensitivity for low energy and low current analyses
Distortion free images
C-Swift is a class-leading, high throughput EBSD detector. As with the Symmetry S2 detector, C-Swift uses a customised CMOS sensor coupled with fibre optics, to deliver both speed and sensitivity, ensuring high quality results on even the most challenging materials.
C-Swift’s maximum speed of 1000 pps is achieved with good pattern resolution (156 x 128 pixels), This represents 4 times the number of pixels than is used by a comparable CCD-based detector operating at similar speeds, ensuring reliable indexing and high hit rates on all types of samples. The distortion-free optics, in partnership with the powerful indexing algorithms in the AZtec software, enables C-Swift to deliver excellent angular precision down below 0.05°. For applications that demand higher quality patterns, C-Swift can collect 622 x 512 pixel patterns at speeds up to 250 pps, making it ideal for complex multi-phase samples and detailed phase analysis.
This is a detector that has been designed for fast, effective sample characterisation. Every component of the system, from the unique proximity sensor to the optional integrated forescatter detectors, has been designed to maximise performance and ease of use, and to make EBSD a standard tool in every laboratory.
The C-Swift detector sets a new standard when speed is key:
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