CMOS-EBSD Detector Range
Discover the market leading range of EBSD detectors based on CMOS technology: a world first in innovative technology.
C-Swift is a class-leading, high throughput EBSD detector. As with the Symmetry detector, C-Swift uses a customised CMOS sensor to deliver both speed and sensitivity, ensuring high quality results on even the most challenging materials.
C-Swift’s maximum speed of 1000 pps is achieved with good pattern resolution (156 x 128 pixels), This represents 4 times the number of pixels than is used by a comparable CCD-based detector operating at similar speeds, ensuring reliable indexing and high hit rates on all types of samples. The distortion-free optics, in partnership with the powerful indexing algorithms in the AZtec software, enables C-Swift to deliver excellent angular precision down below 0.05°. For applications that demand higher quality patterns, C-Swift can collect 622 x 512 pixel patterns at speeds up to 250 pps, making it ideal for complex multi-phase samples and detailed phase analysis.
This is a detector that has been designed for fast, effective sample characterisation. Every component of the system, from the unique proximity sensor to the optional integrated forescatter detectors, has been designed to maximise performance and ease of use, and to make EBSD a standard tool in every laboratory.
The C-Swift detector sets a new standard when speed is key:
National Taiwan University - Oxford Instruments Microscopy School 2019
Oxford Instruments, the global leader in nanoanalysis systems, is proud…