Part of the Oxford Instruments Group


C-Swift is the newest member of our CMOS detector family designed for routine materials analysis and high throughput sample characterisation.
C-Swift benefits from many of the features that have made Symmetry such a groundbreaking EBSD detector including, of course, a customised CMOS sensor designed for EBSD.

  • Guaranteed indexing speeds of 1000 pps

  • 622 x 512 pixel EBSPs at 250 pps

  • Extreme sensitivity for low energy and low current analyses

  • Distortion free images

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C-Swift is a class-leading, high throughput EBSD detector. As with the Symmetry detector, C-Swift uses a customised CMOS sensor to deliver both speed and sensitivity, ensuring high quality results on even the most challenging materials.

C-Swift’s maximum speed of 1000 pps is achieved with good pattern resolution (156 x 128 pixels), This represents 4 times the number of pixels than is used by a comparable CCD-based detector operating at similar speeds, ensuring reliable indexing and high hit rates on all types of samples. The distortion-free optics, in partnership with the powerful indexing algorithms in the AZtec software, enables C-Swift to deliver excellent angular precision down below 0.05°. For applications that demand higher quality patterns, C-Swift can collect 622 x 512 pixel patterns at speeds up to 250 pps, making it ideal for complex multi-phase samples and detailed phase analysis.

This is a detector that has been designed for fast, effective sample characterisation. Every component of the system, from the unique proximity sensor to the optional integrated forescatter detectors, has been designed to maximise performance and ease of use, and to make EBSD a standard tool in every laboratory.

The C-Swift detector sets a new standard when speed is key:

  • Guaranteed indexing speeds of 1000 pps using only 12 nA beam current
  • 156 x 128 pixel pattern resolution at maximum speed – 4 times more pixels than a fast CCD detector at comparable speeds
  • Full resolution (622 x 512) patterns – ideal for detailed phase and deformation analyses
  • Low distortion optics, ensuring an angular precision better than 0.05°.
  • High sensitivity with an optimised phosphor screen, ensuring high quality patterns at low doses and low beam energies – resulting in maximum spatial resolution
  • Seamless EDS integration even at the highest speeds
  • Bellows SEM interface, maintaining the microscope’s vacuum integrity
  • Unique proximity sensor – detects potential collisions before they happen and automatically moves the detector to a safe position
  • Simple and intuitive detector settings, ensuring optimum results every time
  • Five integrated forescatter detectors, providing full colour complementary channelling contrast and atomic number contrast images.

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