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Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.

Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), our tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.

Featured products

Start with nano to explore the infinite, a breakthrough solution for ultra-high resolution FEG-SEM.
Ultim Extreme Infinity ∞
Delivering real-time insights on your Oxford Instruments system to your phone, tablet or PC - stay informed, wherever you are
Oi View
A new SEM imaging technique combines backscattered electrons and X-ray signals to produce high-definition colour images with embedded elemental data
Unity BEX Detector

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Latest News & Events

Nov 12, 2024
EDS gets even faster, simpler, more accurate,…

Oxford Instruments has launched Ultim® Max ‘Infinity’, the latest generation of the world’s most advanced EDS detector range.…

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Oct 30, 2024
NanoAnalysis Scientific Paper Award 2024…

Oxford Instruments Scientific Paper Award 2024 recognises Outstanding scientific papers published 2024 that include results acquired…

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Aug 1, 2024
Unity - winner of prestigious industry award…

Oxford Instruments, a market-leading technology company with a track record of over 60 years of accelerating scientific breakthroughs,…

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Jul
27
M&M 2025
Location: Salt Palace Convention Center, Salt Lake City, Utah
Businesses Attending:
NanoAnalysis, WITec | Raman
View Event >
Jul
27
M&M 2025
Location: Salt Palace Convention Center, Salt Lake City, Utah
Businesses Attending:
NanoAnalysis, WITec | Raman
View Event >
View all events

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