Beam-sensitive materials are challenging to study in an electron microscope. This is particularly so when analysing using the EBSD technique, as the relatively long dwell time required at each pixel coupled with a high probe current and beam energy can easily result in significant sample damage. The solution is often to scan using lower accelerating voltages, typically 8-15 kV, but even then the longer exposure times required to collect good quality EBSD patterns make analyses prohibitively time-consuming. Shell nacre, the sub-micrometre scale layering of aragonite crystals found in many mollusc shells, is one of the most challenging of sensitive materials...
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