Symmetry, the world's first EBSD detector based on CMOS sensor technology, is set to revolutionise EBSD analysis.
Symmetry is the revolutionary all-in-one EBSD detector based on groundbreaking CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and a range of innovative design features.
Guaranteed indexing speeds in excess of 3000 pps
1244 x 1024 pixel resolution
Extreme sensitivity for low energy and low current analyses
Unique low distortion fibre-optic lens
Software controlled detector tilting
Symmetry uses a customised CMOS sensor to unlock a unique and powerful combination of speed, sensitivity and diffraction pattern detail. Symmetry, in combination with the AZtec software, delivers exceptional performance on all materials and for all measurements. The highest analysis speed of Symmetry, in excess of 3000 pps, is more than twice that of any CCD-based EBSD detector on the market yet this is achieved without high beam currents or excessive pixel binning. The detector’s unparalleled sensitivity is due to the unique fibre-optic lens system, ensuring a near-ideal detector efficiency. This means that these high speeds can be achieved even on challenging, real-world samples such as multiphase light metal alloys or deformed steels.
In addition, Symmetry can collect distortion-free, megapixel resolution EBSPs for detailed strain and phase analyses. This is a detector to suit all applications, enhanced by innovative features such as software controlled tilting (with dynamic calibration) and a unique proximity sensor.
Symmetry is truly a game changer and is already opening up new developments in even the most exacting of applications.
The Symmetry detector has an outstanding performance coupled with ease of use, making it the ideal detector for all EBSD applications:
Methylammonium Lead Halides (MALHs) are organic crystal compounds used in solar cells, LEDs, LASERs and photodetectors. Recent improvements to EBSD detectors now allows for their characterisation of grain size and texture.
Combining electron backscatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) techniques for geological sample characterisation, helps to unlock even more information on the likely formation and history of the sample.
CMOS-based EBSD detectors enable faster and more sensitive analyses of samples. Sensitivity is related to the full-system efficiency, or Detective Quantum Efficiency (DQE).
CMOS-based EBSD detectors enable faster and more sensitive analyses of samples.
Martensitic structures are traditionally challenging to measure with EBSD. Here, the sensitivity and pattern detail provided by Symmetry enables exceptional results from a martensitic stainless steel.
In this application note Symmetry is used to characterise a deformed Ni superalloy and a large area across a welded duplex steel.
A relatively simple geological sample, a quartz mylonite, is here characterised in a matter of minutes using Symmetry, collecting data at almost 1000 pps.
In this application, Symmetry is used to characterise a challenging biomaterial, shell nacre, and its performance is compared to conventional CCD-based detectors.
An in-depth look at the structures of a mussel shell, characterised using Symmetry. Both calcite and nanostructured aragonite nacre are measured with an unprecedented level of detail and speed.
Successful TKD analyses require an EBSD detector with both high speed and high sensitivity. The suitability of Symmetry for TKD is demonstrated here on both deformed Al alloys and nanocrystalline Ni.
This technical bulletin looks at the effect of collecting high resolution patterns at high speeds on metals: astonishing angular resolution, even at 3000 pps.
An eclogite sample containing 10 phases has been rapidly analysed using integrated EBSD and EDS. The performance of Symmetry enables high pattern resolution and good indexing, even at 250 pps.