Part of the Oxford Instruments Group


Symmetry is the revolutionary all-in-one EBSD detector based on groundbreaking CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and a range of innovative design features.

  • Guaranteed indexing speeds in excess of 3000 pps

  • 1244 x 1024 pixel resolution

  • Extreme sensitivity for low energy and low current analyses

  • Low distortion optics

  • Software controlled detector tilting

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Symmetry uses a customised CMOS sensor to unlock a unique and powerful combination of speed, sensitivity and diffraction pattern detail. Symmetry, in combination with the AZtec software, delivers exceptional performance on all materials and for all measurements. The highest analysis speed of Symmetry, in excess of 3000 pps, is more than twice that of any CCD-based EBSD detector on the market yet this is achieved without high beam currents or excessive pixel binning. This means that these high speeds can be achieved even on challenging, real world samples such as multiphase light metal alloys or deformed steels.

In addition, Symmetry can collect distortion-free, megapixel resolution EBSPs for detailed strain and phase analyses. This is a detector to suit all applications, enhanced by innovative features such as software controlled tilting (with dynamic calibration) and a unique proximity sensor.

Symmetry is truly a game changer and is already opening up new developments in even the most exacting of applications.

The Symmetry detector has an outstanding performance coupled with ease of use, making it the ideal detector for all EBSD applications:

  • Guaranteed indexing speeds in excess of 3000 pps using only 12 nA beam current
  • 156 x 128 pixel pattern resolution at maximum speed – 16 times more pixels than a fast CCD detector
  • Full resolution (1244 x 1024) patterns – ideal for high resolution (HR)-EBSD strain analyses
  • Low distortion optics, ensuring an angular precision below 0.05°.
  • High sensitivity with an optimised phosphor screen, ensuring high quality patterns at low doses and low beam energies – resulting in maximum spatial resolution
  • Seamless EDS integration even at the highest speeds
  • Software controlled tilting interface coupled with autocalibration – perfect positioning and indexing whatever the sample size
  • Bellows SEM interface, maintaining the microscope’s vacuum integrity
  • Unique proximity sensor – detects potential collisions before they happen and automatically moves the detector to a safe position
  • Simple and intuitive detector settings, ensuring optimum results every time
  • Five integrated forescatter detectors, providing full colour complementary channelling contrast and atomic number contrast images.

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