Applications
TruMap
TruMap deconvolutes overlapping peaks and removes background accounting for the elements present, to produce true elemental maps. This becomes even more important when mapping at low KeV, where the number of available peaks is limited.
This map is acquired at 3 keV and resolves sub 20 nm features. The tungsten (W) Ma peak at 1.774 keV overlaps with a silicon (Si) ka peak at 1.740 keV. Maps with a standard energy window show a W distribution which is a combination of both W and Si signals. TruMap deconvolutes the peaks to give an accurate W map. The presence of the heavy element (W) increases the background signal, even without an overlap. This can create a shadow map, as seen in the copper signal. TruMap accounts for the change in background and adjusts the map display accordingly.
AZtecCrystal
AZtecCrystal is a modern, comprehensive EBSD data analysis software package designed to blend ease of use for relative newcomers to EBSD with an array of advanced tools for expert users. The software has been designed to handle the exceptionally large EBSD datasets that are now commonplace with our latest, high-speed CMOS-based EBSD detectors.
AZtecCrystal will allow you to perform all of the routine analyses that are necessary when processing EBSD datasets, including the creation of maps, analyses of crystallographic texture, examination of grain boundary properties and a comprehensive range of grain measurement tools. In addition, advanced functionality includes the calculation of elastic properties from grain orientation data, advanced phase classification / discrimination and the rapid reconstruction of parent grain microstructures in systems that have undergone displacive phase transformations.
AZtecCrystal is the ideal software for any user wishing to rapidly and effectively process and interrogate their EBSD data.
AZtecFeature
AZtecFeature is a particle analysis platform that automates the detection, morphological measurement, compositional analysis and classification of particle/granular/inclusion samples. By measuring both composition and morphological information on a particle by particle basis, AZtecFeature allows you to interpret your data in real time with powerful and easy to create classification schemes and data review plots.
All of the automatically acquired data in AZtecFeature is processed with AZtec’s Tru-Q® algorithms to ensure reliability and accuracy in the identification and quantification of elements in your samples – ensuring you get the right results each time.
AZtecLayerProbe
AztecLayerProbe is a tool for the characterisation of layered thin film structures in the SEM. Working with layer stacks up to 2μm thick, LayerProbe is able to calculate, from an EDS analysis, layer thickness and composition. With proven accuracy across multiple critical applications including electronic devices, material coatings, energy devices and many more, LayerProbe is the ideal tool for both research and routine non-destructive analysis of layered samples – down to a nanometer scale.
