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Latest Brochures

Ultim Max TEM

Ultim Max is the next generation of Silicon Drift Detectors (SDD) utilising our Extreme electronics to generate maximised sensitivity with increased throughput. This powers AZtecTEM, the market-leading software that delivers unparalleled elemental characterisation performance in the TEM.

 

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AZtecLive & Ultim Max

AZtecLive takes the EDS technique from the static to the dynamic with real-time chemical imaging. AZtecLive is powered by Ultim Max, the next generation SDD detectors combining the largest sensor sizes (170 mm2 and 100 mm2) with Extreme electronics to deliver unparalleled speed and sensitivity.

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Symmetry

Symmetry, the world's first EBSD detector based on CMOS sensor technology, is set to revolutionise EBSD analysis.

 

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CMOS EBSD Range

Discover the market leading range of EBSD detectors based on CMOS technology: a world first in innovative technology.

 

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AZtecOne & X-MaxN 20

The combination of the simple-to-use yet powerful AZtecOne EDS analysis software with the proven stability and accuracy of the X-MaxN 20 SDD, provides a powerful solution for EDS analysis in the SEM.

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AZtecFeature

AZtecFeature is an innovative system for particle analysis in the SEM. It is specifically optimised for usability and high-speed throughput. This 12 page brochure gives an overview of the system.

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AZtecGSR

AZtecGSR automates the analysis of Gunshot Residue Analysis in the SEM to provide fast, accurate and reproducible results to ASTM E1588 - 10e1.

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AZtecHKL

This 16 page brochure illustrates why AZtec is the leading EBSD analysis platform on the market. Covers both hardware and software.

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AZtecOne & x-act

This two page flier gives an overview of the AZtecOne package, providing an ideal solution for carrying out a complex task like EDS as quickly and as easily as possible.

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AZtecTEM

A 16 page brochure showing why AZtecTEM is the most powerful solution for EDS on the TEM. It comprises software and hardware sections (inc X-Max 100TLE and X-Max TSR).

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E3 Electrical Microanalysis System

The E3 quantitative nanoprobing microanalysis system enables the electrical characterisation of devices and materials in the SEM & FIB.

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INCAWave

The only way to achieve EPMA performance on a SEM.

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LayerProbe

LayerProbe analyses the composition and thickness of the surface and sub-surface layers of a specimen. A non-destructive tool based on established microanalysis technology, it is more cost-effective, higher resolution, and more accurate than dedicated film measurement tools.

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OmniProbe 400

This brochure goes into the features and benefits of our flagship nanomanipulator, the OmniProbe 400

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X-Max Extreme

The X-Max Extreme is a windowless 100mm2 version of X-Max designed to maximise sensitivity and spatial resolution. It uses a radical geometry to optimise both imaging and EDS performance in ultra-high resolution FEG-SEMs.

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