Part of the Oxford Instruments Group
AZtecLive takes the EDS technique from the static to the dynamic with real-time chemical imaging. AZtecLive is powered by Ultim Max, the next generation SDD detectors combining the largest sensor sizes (170 mm2 and 100 mm2) with Extreme electronics to deliver unparalleled speed and sensitivity.
Symmetry, the world's first EBSD detector based on CMOS sensor technology, is set to revolutionise EBSD analysis.
Discover the market leading range of EBSD detectors based on CMOS technology: a world first in innovative technology.
AZtecEnergy EDS Microanalysis software characterises material composition of samples inside a SEM or FIB. This 20 page brochure shows why AZtecEnergy is the world's leading EDS solution.
AZtecFeature is an innovative system for particle analysis in the SEM. It is specifically optimised for usability and high-speed throughput. This 12 page brochure gives an overview of the system.
AZtecGSR automates the analysis of Gunshot Residue Analysis in the SEM to provide fast, accurate and reproducible results to ASTM E1588 - 10e1.
This 16 page brochure illustrates why AZtec is the leading EBSD analysis platform on the market. Covers both hardware and software.
A 16 page brochure showing why AZtecTEM is the most powerful solution for EDS on the TEM. It comprises software and hardware sections (inc X-Max 100TLE and X-Max TSR).
The E3 quantitative nanoprobing microanalysis system enables the electrical characterisation of devices and materials in the SEM & FIB.
LayerProbe analyses the composition and thickness of the surface and sub-surface layers of a specimen. A non-destructive tool based on established microanalysis technology, it is more cost-effective, higher resolution, and more accurate than dedicated film measurement tools.
This brochure goes into the features and benefits of our flagship nanomanipulator, the OmniProbe 400
The X-Max Extreme is a windowless 100mm2 version of X-Max designed to maximise sensitivity and spatial resolution. It uses a radical geometry to optimise both imaging and EDS performance in ultra-high resolution FEG-SEMs.
From 20 mm2 to a combined working area of 600 mm2, the X-MaxN range of Silicon Drift Detectors provides a powerful solution for EDS analysis in the SEM. This 12 page brochure shows why.
© Oxford Instruments 2018