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EDS
EDS for TEM

AZtec provides the ultimate materials characterisation system for EDS applications in the TEM and STEM. It is ideal for users working at the frontiers of analytical performance.

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EDS for TEM Explained

This document gives an introduction to EDS applications in the Transmission Electron Microscope (TEM).

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AZtecTEM

This brochure shows why AZtecTEM is the most powerful solution for EDS on the TEM.

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Simultaneous EDS and EELS in the TEM

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Semiconductor Mapping in the TEM - Solving peak overlaps in real-time

Development and testing of semiconductor devices requires extensive knowledge of local structure and elemental composition.

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