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EDS
EDS for TEM

AZtec provides the ultimate materials characterisation system for EDS applications in the TEM and STEM. It is ideal for users working at the frontiers of analytical performance.

Also available our X-MaxN range of Silicon Drift Detectors

Brochures

Ultim Max TEM

Ultim Max is the next generation of Silicon Drift Detectors (SDD) utilising our Extreme electronics to generate maximised sensitivity with increased throughput. This powers AZtecTEM, the market-leading software that delivers unparalleled elemental characterisation performance in the TEM.

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EDS for TEM Explained

This document gives an introduction to EDS applications in the Transmission Electron Microscope (TEM).

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AZtecTEM

This brochure shows why AZtecTEM is the most powerful solution for EDS on the TEM.

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Application Notes

Simultaneous EDS and EELS in the TEM

Simultaneous acquisition of EDS and EELS is a powerful tool for materials analysis

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Semiconductor Mapping in the TEM - Solving peak overlaps in real-time

Development and testing of semiconductor devices requires extensive knowledge of local structure and elemental composition.

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