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X-MaxN

The X-MaxN Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of all types of samples including fragile samples and nano-materials.


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The X-MaxN Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of all types of samples including fragile samples and nano-materials.

The X-MaxN Silicon Drift Detector is a 20 mm2 

  • X-MaxN provides a superb resolution that is independent of sensor size - specifications guaranteed to ISO15632:2012
  • The same mechanical geometry inside the microscope means that the count rate simply increases in proportion to sensor size
  • Excellent low energy analysis, including Be detection

Performance independent of size

  • X-MaxN resolution and low energy detectability are independent of sensor size because of its external FET design.
  • The same sensor position means that the count rate simply increases in proportion to sensor size
  • Excellent low energy analysis, including Be detection
  • LN2 not required. X-MaxN is ready to start working in minutes

 

Benefits

  • Maximise information from the smallest nano-particles and features
  • Quantitative analysis with pulse pile-up correction at many 100s of thousand counts per second
  • Detect low concentrations of minor elements faster
  • Collect X-ray maps using only a few pA on the most unstable samples
  • Maximise information from the smallest nano-particles and features
  • Quantitative analysis with pulse pile-up correction at many 100s of thousand counts per second
  • Detect low concentrations of minor elements faster

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AZtecOne & X-MaxN 20

The combination of the simple-to-use yet powerful AZtecOne EDS analysis software with the proven stability and accuracy of the X-MaxN 20 SDD, provides a powerful solution for EDS analysis in the SEM.

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SDD Explained

This guide describes how SDD hardware detects and measures the X-rays and converts them into signals which can be used by EDS software to provide accurate and reliable analysis.

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