Unlock the Infinite potential of EDS

Learn what is now possible with Infinity detectors from Oxford Instruments

Infinity detectors are the new generation of Ultim EDS detectors from Oxford Instruments. They keep many of the key performance characteristics of Ultim® detectors but offer new capabilities to enable EDS to solve more complex challenges or to solve the routine ones, faster and more reliably.

The webinar focuses on two areas of new capability. The first is nano-characterisation using X-ray mapping with large area Ultim Max Infinity and our special windowless solution for ultra-high spatial resolution Ultim Extreme. While the incredible low energy spectral resolution achieved by all Infinity detectors is crucial to moving this area of SEM-based characterisation forward, as shown accurate spectrum processing is equally important, and together produces some incredible results.

The second area is fast characterisation of minor and trace elements. For many years there has been the promise of EDS with the resolution of WDS, but we are finding with Infinity and Tru-Q IQ processing that with the latest EDS detectors, and individual detector processing optimisation, many applications that are thought to require WDS can now be done faster and of course much more easily using EDS.

The webinar shows how we have added additional IQ to our Tru-Q spectrum and data processing engine, by characterising each Infinity detector performance on a SEM and using that to Optimise the processing of the data from each detector. In this way each detector will produce the best results enabling us to revolutionise EDS in new ways

EDS capability continues to develop and bring capabilities onto a SEM that were normally thought to require TEM, EPMA, Auger, XPS etc. Watch this webinar to see what can now be characterised using the Infinite potential of the latest in EDS technology.

You will learn:

• What is new and different about Infinity EDS detectors
• How Tru-Q IQ individual detector optimised spectrum processing increases accuracy and sensitivity
• How these new technologies allow us to characterise smaller and more complex nano-structures
• How EDS can map faster, more accurately and is starting to rival the sensitivity of WDS for some applications