Rapid SEM analysis of an electronic device using BEX and Unity

running time: 5:36

A demonstration of the ease and speed with which the quality and composition of electronic devices can be analysed in SEM using the Unity detector and the BEX technique. Large amount of signal Unity produces allows to rapidly identify and report on a potential cause of failure in the device; also it is demonstrated how quickly Unity can be used to check for conformity over a large areas.

By watching this video, you will learn how:

• Unity allows rapid checks for contamination or failure
• Easily areas of nonconformity can be identified
• Large areas can be rapidly analysed using Cartography mode

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