Unlock HR-EBSD Strain Analysis using MapSweeper

MapSweeper Strain Analysis shows good correlation with a much-accepted industry-standard benchmark solution and showcases the reliability of HR-EBSD strain analysis in AZtecCrystal. MapSweeper can produce reliable strain maps using 622x512 pattern resolution 8bit patterns (Speed 1 mode in AZtec), allowing for quicker data acquisition, faster analysis and easier data handling. The added benefit of using multiple calibration points to account for changes in the pattern centre are shown and the ease of selecting/changing the reference pattern is reported. This means that HR-EBSD strain analysis can now be achieved on one platform, making it a routine part of data analysis without the need for HR-EBSPs or dedicated HR-EBSD software.

By downloading this application note, you will learn:

• Excellent correlation with existing Strain Analysis software
• Routine Strain Analysis now part of AZtecCrystal
• Reliable Strain Mapping over larger areas (>150microns)