Imaging of Layered Polymer Structures and Failure Analysis

The compact Xplore Silicon Drift Detector (SDD) is the ideal detector for routine EDS analysis in the SEM. The introduction of Xplore complements Oxford Instruments comprehensive…

Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

LayerProbe is an exciting software tool for thin film analysis in the SEM. An option for the AZtec EDS microanalysis system, LayerProbe is faster, more cost-effective and higher resolution…