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Application

Imaging of Layered Polymer Structures and Failure Analysis

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  3. Imaging of Layered Polymer Structures and Failure Analysis

Related to: Polymers

Products

LayerProbe is an exciting software tool for thin film analysis in the SEM. An option for the AZtec EDS microanalysis system, LayerProbe is faster, more cost-effective and higher resolution…

AZtec LayerProbe

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Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

Ultim® Extreme

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The compact Xplore Silicon Drift Detector (SDD) is the ideal detector for routine EDS analysis in the SEM. The introduction of Xplore complements Oxford Instruments comprehensive…

Xplore

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