Ultim Max is the next generation of Silicon Drift Detectors (SDD). Combining the largest sensor sizes with Extreme electronics to deliver unparalleled speed and sensitivity.
The large 100 mm2 and 170 mm2 SDD sensors of Ultim Max allows up to 17x more data to be collected in the same time with no loss of accuracy. Whether you want to map larger areas, have better statistics in each data point, collect data much faster, or investigate the smallest nano-structures, Ultim Max is the ultimate solution for X-ray analysis in the SEM.
Speed - The combination of Extreme electronics with the X4 pulse processor allows Ultim Max to map samples at count rates of 1,500,000 cps and accurately quantify composition at 400,000 cps.
Sensitivity - Size really does matter. Use the large 100 mm2 and 170 mm2 sensor areas of Ultim Max to deliver unparalleled count rate under the most demanding analytical conditions.