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Ultim® Max

Ultim Max is the next generation of Silicon Drift Detectors (SDD). Combining the largest sensor sizes with Extreme electronics to deliver unparalleled speed and sensitivity.


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Ultim Max is the next generation of Silicon Drift Detectors (SDD). Combining the largest sensor sizes with Extreme electronics to deliver unparalleled speed and sensitivity.

The large SDD sensors of Ultim Max allows up to 17x more data to be collected in the same time with no loss of accuracy. Whether you want to map larger areas, have better statistics in each data point, collect data much faster, or investigate the smallest nano-structures, Ultim Max is the ultimate solution for X-ray analysis in the SEM.

Speed - The combination of Extreme electronics with the X4 pulse processor allows Ultim Max to map samples at count rates of 1,500,000 cps and accurately quantify composition at 400,000 cps.

Sensitivity - Size really does matter. Use the large 100 mm2 and 170 mm2 sensor areas of Ultim Max to deliver unparalleled count rate under the most demanding analytical conditions.

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AZtecLive & Ultim Max

AZtecLive takes the EDS technique from the static to the dynamic with real-time chemical imaging. AZtecLive is powered by Ultim Max, the next generation SDD detectors combining the largest sensor sizes with Extreme electronics to deliver unparalleled speed and sensitivity.

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SDD Explained

This guide describes how SDD hardware detects and measures the X-rays and converts them into signals which can be used by EDS software to provide accurate and reliable analysis.

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Ultim Max TEM

Ultim Max is the next generation of Silicon Drift Detectors (SDD) utilising our Extreme electronics to generate maximised sensitivity with increased throughput. This powers AZtecTEM, the market-leading software that delivers unparalleled elemental characterisation performance in the TEM.

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Ultim Extreme

The Ultim Extreme is a windowless 100 mm2 version of Ultim designed to maximise sensitivity and spatial resolution. It uses a radical geometry to optimise both imaging and EDS performance in ultra-high resolution FEG-SEMs.

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