Products
FIB-SEM
Nanomanipulators
OmniProbeOmniProbe CryoSoftware
AZtec3DAZtecFeatureAZtec LayerProbeTEM
Hardware
EDSUltim MaxXplore for TEMImaging
TEM CamerasSoftware
AZtecTEM
Historically, the analysis of polished rock samples has been primarily carried out using cross-polarised optical microscopy – an often time-consuming and laborious technique which relies on the user’s skill to identify each phase. This may be done with a point counting sampling approach with the results extrapolated to the whole sample. While this approach can be very powerful when performed by an experienced mineralogist/petrologist, no direct measurement is made of the chemistry of the various phases or their morphology.
AZtecFeature, used in conjunction with large area X-MaxN SDDs can automate this process enabling complex mineralogies to be characterised quickly and accurately.
By downloading this application note you will see:
*Please note, this application note refers to X-Max. This has since been upgraded to Ultim Max.
Get my copy!