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Characterisation of an additively manufactured Ni-base superalloy

X-Max Extreme provides the capability to investigate the elemental distribution in structures down to the 10 nm scale in the SEM due to its high sensitivity when working at very low accelerating voltage.

This capability is important for the study of samples with microstructural features with a broad range of scales that have previously required a range of SEM and TEM analysis. By doing more of the analysis in the SEM, time is saved in analysis and sample preparation, and nanostructures can be easily studied in the context of the microstructure of the sample.

This application note studies the structure of a Ni-base superalloy 718 to determine the effect of using a laser-assisted additive manufacture method for its fabrication.

By downloading this application note you will see:

  • How by using X-Max Extreme at a low accelerating voltage in conjunction with in-lens backscatter imaging allows elemental characterisation of complex multi-scale microstructure from the mico- to the 10 nm scale

*Please note, this application refers to X-Max Extreme, this has since been upgraded to Ultim Extreme

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