Part of the Oxford Instruments Group

EuFN 2019

We provide comprehensive solutions for enhanced sample preparation and analysis in FIB-SEM. Lift-out is common application used to prepare TEM lamella, atom probe samples and 3D analysis blocks. Our OmniProbe nanomanipulators mean you can:

Our advanced analytical solutions are able to enhance this process with:

The analytics also provide complete microstructure and elemental analysis in 2D and 3D for bulk and lift-out samples

Transmission Kikuchi Diffraction (TKD) of Metals

Successful TKD analyses require an EBSD detector with both high speed and high sensitivity. The suitability of Symmetry for TKD is demonstrated here on both deformed Al alloys and nanocrystalline Ni.


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