OmniProbe 400

A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and performance, the OmniProbe 400 is the ultimate nanomanipulator for high resolution and high throughput applications.

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A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and performance, the OmniProbe 400 is the ultimate nanomanipulator for high resolution and high throughput applications.

4³ performance

Nanoscale manipulation and testing in the SEM and varied lift-out TEM sample preparations in the FIB can be performed easily while using optimized working distances

4 degrees of freedom (X, Y, Z, R)
4 mm or more working distance
4 motion strengths: encoder resolution, motor resolution, repeatability, linearity

Accuracy

Nanometre-resolution piezo actuators and 10nm closed-loop encoders provide industry-leading precision, linearity and smooth motion

Speed

Automation on multiple levels enables results in the fewest steps possible

Insertion repeatability eliminates tip realignment
Change tips in 3 minutes without venting
Concentric rotation enables rapid tip sharpening, tip cleaning, and sample repositioning
Safely and precisely navigate to stored positions close to the sample and back to park

Accurate closed-loop feedback control

The OmniProbe 400 uses a closed-loop control to deliver smooth motion, dependable accuracy, and a high degree of integration. In addition to very high motion resolution, the OmniProbe 400 integrates motorized concentric rotation and fast in situ tip changes as standard:

Non-pneumatic insertion and retraction is gentle to fragile samples
Move with high accuracy, linearity and repeatability
Move diagonally in ANY direction (omnidirectionality)
Navigate orthogonally at any sample tilt
Rapidly orient samples to specific angles
Perform smooth and precise manipulation over long distances
Always know where the probe tip is, even when outside the field of view
Move predictably for all port installations
Use fixed and user-programmable positions to reduce operator fatigue and increase success rates
Avoid collisions
Rotate concentrically
Change tips in situ

In-situ tip change

Probe needles can be replaced in under 3 minutes without venting the microscope
Atmospheric contamination is avoided and the high vacuum preserved for the best performance
Samples attached to tips can be safely stored for later use, allowing multiple users to maintain their throughput

Concentric rotation

The tip stays in the field of view for rapid tip shaping and sample reorienting without risk of sample loss or accidental venting.

Position with sub-degree accuracy
Extend the needle life
Create fine tips exhibiting ohmic behaviour
Prepare micro tips for nanoparticle manipulations that use Van der Waals forces
Reorient samples for plan-view, side-view and backside preparations

Discover our comparison table below to help you choose the best OmniProbe for your application and to compare specifications.


SPECIFICATION	OMNIPROBE
	OmniProbe 350 Cryo lift-out	OmniProbe 350	OmniProbe 400
Linearity	500 nm	500 nm	250 nm
Encoder resolution	<50 nm	<50 nm	10 nm
Insertion repeatability	15 μm*	5 μm	2 μm
Min velocity	50 nm/s	50 nm/s	10 nm/s
Max Velocity	250 μm/s	250 μm/s	500 μm/s
Compucentric rotation	✘	✘	✔
Integrated temperature sensor	✔	✘	✘
APPLICATION
Site specific lift-out	✔	✔	✔
Plan-view	P	P	✔
Vent free plan-view	✘	✘	✔
Backside Thinning	✘	✘	P
Atom Probe tomography sample preparation	P	P	✔
Cryogenic liftout	✔	✘	✘
Voltage contrast imaging	✘	✔	✔
Charge neutralisation	✔	✔	✔
On-Tip analysis	✘	✘	✔
EBIC measurements	✘	O	O
EBAC measurements	✘	O	O
In Situ tip change	✘	O	✔

P: Requires an OmniPivot holder O: Available as Option * at constant temperature

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Application Notes

Multi-Scale Analysis of Dislocations and Grain Boundaries for Improving mc-Si Solar Cell Performance

Solar cells are being increasingly used globally and it is important that improvements are made on the production of Mc-Si cells to enhance efficiency. Analysis of these solar cells using EBIC, TEM and APT.

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