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AZtecOne

The AZtecOne system combines the simple-to-use yet powerful AZtecOne software and the proven stability and accuracy of either the X-Max 20mm2 or x-act 10mm2  Silicon Drift Detector. The AZtecOne system is the ideal solution for carrying out a complex task like EDS as quickly and as easily as possible.

There is no need for substantial training or advanced knowledge of the EDS technique. Users can be trained in a matter of minutes and will have complete confidence in their results.

  • Easy and intuitive
  • Accurate and dependable
  • Fast and productive
  • Ideal for multi-user labs


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Easy and intuitive

  • With AZtecOne users have all the necessary tools at hand to complete the task quickly and with ease.
  • Streamlined interface minimises the number of steps to get a result
  • New users can be productive in a matter of minutes
  • No need for the infrequent user to be retrained every time they need to perform an analysis

Accurate and dependable

  • AZtecOne works hard behind the scenes so users don’t have to worry about pulse pile-ups, overlapping peaks and other potential artifacts.
  • Tru-Q® technology ensures that users can depend on the elements being automatically detected and that the correct results are being reported
  • TruMap (option) ensures that the real data distribution is shown on X-ray maps and LineScans

Fast and productive

  • AZtecOne focuses on getting results out as quickly as possible: rapid set-up, real-time results display, reports just a click of a button away
  • From image to report in seconds
  • Fully interactive during acquisition
  • During acquisition users can interact with data in the current or stored projects
  • Quick and straightforward report generation
  • Choose components (maps, spectra, linescans) required in the report and AZtecOne does the rest

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AZtecOne & x-act

This two page flier gives an overview of the AZtecOne package, providing an ideal solution for carrying out a complex task like EDS as quickly and as easily as possible.

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AZtecOne & X-MaxN 20

The combination of the simple-to-use yet powerful AZtecOne EDS analysis software with the proven stability and accuracy of the X-MaxN 20 SDD, provides a powerful solution for EDS analysis in the SEM.

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The x-act is a fully quantitative SDD with excellent performance at low and high count rates. It provides all the benefits of Oxford Instruments’ renowned technology in a package that is suitable for applications that do not demand the full performance of the large area X-MaxN detectors.

x-act incorporates 40 years of Oxford Instruments’ expertise, and is backed up by worldwide sales, service and customer support specialists.

  • Reliable AutoID for element identification
  • Accurate quant – all count rates
  • Stability guaranteed from 1,000 to 100,000 cps – peak shift and resolution change
  • Full software correction at very high count rates including pile-up correction
  • Excellent low energy analysis with detection from Be to Pu
  • Resolution guaranteed on SEM at MnKa, FKa, and CKa
  • In compliance with ISO 15632:2012
  • Fully integrated analytical hardware chain for fast, reliable analytical performance

SDD Detector - LN2-free operation

Up to 10x count rates of Si(Li) detectors - for increased productivity and no loss of analytical performance

 

The X-MaxN range of Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of all types of samples including fragile samples and nano-materials.

The X-MaxN Silicon Drift Detector is a 20 mm2 

  • A range of silicon drift detector sizes, from 150 mm2 to 20 mm2
  • X-MaxN provides a superb resolution that is independent of sensor size - specifications guaranteed to ISO15632:2012
  • The same mechanical geometry inside the microscope means that the count rate simply increases in proportion to sensor size
  • Excellent low energy analysis, including Be detection

Performance independent of size

  • X-MaxN resolution and low energy detectability are independent of sensor size because of its external FET design.
  • The same sensor position means that the count rate simply increases in proportion to sensor size
  • Excellent low energy analysis, including Be detection
  • LN2 not required. X-MaxN is ready to start working in minutes

 

Benefits

  • Maximise information from the smallest nano-particles and features
  • Quantitative analysis with pulse pile-up correction at many 100s of thousand counts per second
  • Detect low concentrations of minor elements faster
  • Collect X-ray maps using only a few pA on the most unstable samples
  • Maximise information from the smallest nano-particles and features
  • Quantitative analysis with pulse pile-up correction at many 100s of thousand counts per second
  • Detect low concentrations of minor elements faster

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