AZtecOne

The AZtecOne system combines the simple-to-use yet powerful AZtecOne software and the proven stability and accuracy of either the X-Max 20mm² or x-act 10mm² Silicon Drift Detector. The AZtecOne system is the ideal solution for carrying out a complex task like EDS as quickly and as easily as possible.

There is no need for substantial training or advanced knowledge of the EDS technique. Users can be trained in a matter of minutes and will have complete confidence in their results.

Full overview >

Easy and intuitive
Accurate and dependable
Fast and productive
Ideal for multi-user labs

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Overview

Easy and intuitive

With AZtecOne users have all the necessary tools at hand to complete the task quickly and with ease.
Streamlined interface minimises the number of steps to get a result
New users can be productive in a matter of minutes
No need for the infrequent user to be retrained every time they need to perform an analysis

Accurate and dependable

AZtecOne works hard behind the scenes so users don’t have to worry about pulse pile-ups, overlapping peaks and other potential artifacts.
Tru-Q^® technology ensures that users can depend on the elements being automatically detected and that the correct results are being reported
TruMap (option) ensures that the real data distribution is shown on X-ray maps and LineScans

Fast and productive

AZtecOne focuses on getting results out as quickly as possible: rapid set-up, real-time results display, reports just a click of a button away
From image to report in seconds
Fully interactive during acquisition
During acquisition users can interact with data in the current or stored projects
Quick and straightforward report generation
Choose components (maps, spectra, linescans) required in the report and AZtecOne does the rest

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AZtecOne & x-act

This two page flier gives an overview of the AZtecOne package, providing an ideal solution for carrying out a complex task like EDS as quickly and as easily as possible.

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AZtecOne & X-Max^N 20

The combination of the simple-to-use yet powerful AZtecOne EDS analysis software with the proven stability and accuracy of the X-Max^N 20 SDD, provides a powerful solution for EDS analysis in the SEM.

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x-act
X-Max

The x-act is a fully quantitative SDD with excellent performance at low and high count rates. It provides all the benefits of Oxford Instruments’ renowned technology in a package that is suitable for applications that do not demand the full performance of the large area X-Max^N detectors.

x-act incorporates 40 years of Oxford Instruments’ expertise, and is backed up by worldwide sales, service and customer support specialists.

Reliable AutoID for element identification
Accurate quant – all count rates
Stability guaranteed from 1,000 to 100,000 cps – peak shift and resolution change
Full software correction at very high count rates including pile-up correction
Excellent low energy analysis with detection from Be to Pu
Resolution guaranteed on SEM at MnKa, FKa, and CKa
In compliance with ISO 15632:2012
Fully integrated analytical hardware chain for fast, reliable analytical performance

SDD Detector - LN2-free operation

Up to 10x count rates of Si(Li) detectors - for increased productivity and no loss of analytical performance

The X-Max^N range of Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of all types of samples including fragile samples and nano-materials.

The X-Max^N Silicon Drift Detector is a 20 mm²

A range of silicon drift detector sizes, from 150 mm² to 20 mm²
X-Max^N provides a superb resolution that is independent of sensor size - specifications guaranteed to ISO15632:2012
The same mechanical geometry inside the microscope means that the count rate simply increases in proportion to sensor size
Excellent low energy analysis, including Be detection

Performance independent of size

X-Max^N resolution and low energy detectability are independent of sensor size because of its external FET design.
The same sensor position means that the count rate simply increases in proportion to sensor size
Excellent low energy analysis, including Be detection
LN₂ not required. X-Max^N is ready to start working in minutes

Benefits

Maximise information from the smallest nano-particles and features
Quantitative analysis with pulse pile-up correction at many 100s of thousand counts per second
Detect low concentrations of minor elements faster
Collect X-ray maps using only a few pA on the most unstable samples
Maximise information from the smallest nano-particles and features
Quantitative analysis with pulse pile-up correction at many 100s of thousand counts per second
Detect low concentrations of minor elements faster