Inspection and Process Control

Relate is a correlative software package optimised to work with EM, EDS, EBSD, & AFM data and images.  It provides the tools you need to correlate data from different microscopes,…

AZtecBattery is a powerful, automated, solution for the analysis of powders used in the manufacturing of battery materials and batteries. AZtecBattery is ideal for the detection…

Collecting good quality data is only the beginning of any complete EBSD analysis. AZtecCrystal provides all the necessary tools to process and interrogate your EBSD data and to solve…

The Pharmaceutical and Biomedical industries require EDS systems to show that their electronic records are trustworthy, reliable, and equivalent to paper records. AZtecPharma is…

LayerProbe is an exciting software tool for thin film analysis in the SEM. An option for the AZtec EDS microanalysis system, LayerProbe is faster, more cost-effective and higher…

AZtecTEM is an innovative EDS software specifically optimised for advanced TEM applications.

AZtecTEM is a unique system approach to the characterisation of materials at…

AZtecLiveOne software platform is the ideal solution for carrying out a complex task like EDS as quickly and as easily as possible. No need for substantial training or advanced knowledge…

The most powerful EBSD software available, AZtecHKL combines speed and accuracy of results for routine analysis, with the flexibility and power required for applications that push…

Ultim Max is the next generation of Silicon Drift Detectors (SDD). Combining the largest sensor sizes with Extreme electronics to deliver unparalleled speed and sensitivity.

AZtecFeature is an innovative particle analysis system specifically optimised for usability and high-speed throughput. It combines the raw speed and sensitivity of the Ultim Max Silicon…

AZtecAM is a powerful, automated, solution for the analysis of metal powders used in additive manufacturing. Based on AZtecFeature, AZtecAM optimises the particle analysis workflow…

The compact Xplore Silicon Drift Detector (SDD) is the ideal detector for routine EDS analysis in the SEM.

The introduction of Xplore complements Oxford…