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Understanding temperature induced microstructural changes in additively manufactured alloys
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Understanding temperature induced microstructural changes in additively manufactured alloys | 21 Jan
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Ultim

Products

Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

Ultim® Extreme

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Ultim Max is the next generation of Silicon Drift Detectors (SDD). Combining the largest sensor sizes with Extreme electronics to deliver unparalleled speed and sensitivity.

Ultim® Max

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