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WDS (or WDX) stands for Wavelength Dispersive X-ray Spectrometry.
WDS is an analytical technique used to determine elemental composition by measuring characteristic X-rays generated by bombarding a solid with an electron beam. It is typically used to identify elements or quantitatively determine element concentrations at specific micron-sized points on a sample, or to map the distribution of elements across a sample surface.
The X-ray signal measured by WDS is the same as exploited by the more commonly used technique for elemental determination on a scanning electron microscope (SEM) - Energy Dispersive Spectrometry (EDS /EDX).
The spectral resolution of WDS is ~10x higher than EDS, enabling:
Wave is the only fully focusing Rowland circle geometry WD spectrometer offered for the SEM - giving the best spectral resolution
available. Combining a Wave spectrometer with an Ultim Max EDS detector brings together the advantages of both techniques – speed and sensitivity – offering unparalleled accuracy for element identification and compositional measurement on the SEM.
| EDS (Ultim Max) | WDS (Wave Spectrometer) | |
| Spectral resolution (eV) | ~50 – 200 | ~2 – 20 |
| Detection limit (ppm) | ~1000 | <100 for many elements |
| Measurable element range | Be - Pu (Li on the Ultim Extreme) | Be - Pu |
Discover the five main reasons to add a Wave spectrometer to your SEM:
Find out more on Wave
AZtecWave takes the complexity out of WDS analysis and combining it with EDS analysis. It delivers:
Discover more about AZtecWave and the five main reasons to upgrade an INCA Wave system:
Learn More on AZtecWave 5 Reasons to Upgrade
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