Analysing Particles using Electron Backscatter Diffraction (EBSD)

EBSD is a powerful tool for microstructural characterisation of crystalline materials and has been used extensively in additive layer manufacturing research as well as powder metallurgy and particle analysis. However, these often-complicated microstructures are made up of structures and particles that have their own crystallographic orientations. Measuring the crystallographic orientation of each particle has proven to be historically constrained by only one coordinate reference system and often users only represent orientations in the Z-direction.

This tutorial will introduce the new ‘Particle Analysis’ tool included in AZtecCrystal 3.2 for EBSD analysis. The new particle analysis feature can characterise the crystal orientations, grain shapes, and boundary traces relative to the spherical shape of each particle. New orientation maps can also be generated, and the tutorial will explain how to plot and interpret radial and tangential ipf colour maps.

Discover how this feature can be used to characterise particle microstructures used in the electronics industry, in-particular for NMC cathodes.

You will learn: 

• How to analyse particles in AZtecCrystal 3.2
•  How to manually define the particle centre
•  What radial and tangential IPF maps represent