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			FIB-SEM
		Nanomanipulators
OmniProbeOmniProbe CryoSoftware
AZtec3DAZtecFeatureAZtec LayerProbeTEM
Hardware
EDSUltim MaxXplore for TEMImaging
TEM CamerasSoftware
AZtecTEM
	Application Specific Software
		Additive manufacturingAutomated mineralogyBattery materialsCorrelative microscopyFibre analysisGeological materialsGunshot residueHigh Temperature EDS analysisNon-metallic inclusionsParticle AnalysisPharma applicationsTechnical cleanlinessData Processing Software
AZtecFlexAZtecCrystalRelateSample Preparation
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