Characterisation of Low Dimensional Structures

The X-Max^N Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of…

Our flagship SDD detector for TEM, the X-Max^N 100TLE provides the perfect solution for field emission and aberration corrected TEMs working at the frontiers of nanoscience.

The most powerful EBSD software available, AZtecHKL combines speed and accuracy of results for routine analysis, with the flexibility and power required for applications that push…

This windowless silicon drift detector sensor for TEM applications provides a collection solid angle in the range 0.3 to 0.7 steradians*. Its superb collection efficiency over the…

Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

AZtecTEM is an innovative EDS software specifically optimised for advanced TEM applications.

AZtecTEM is a unique system approach to the characterisation of materials at…

The X-Max^N range of SDD for TEM exploits a new sensor chip, new electronics, and innovative packaging to deliver a truly ‘next generation’ SDD performance.

Symmetry is the revolutionary all-in-one EBSD detector based on groundbreaking CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and…

LayerProbe is an exciting software tool for thin film analysis in the SEM. An option for the AZtec EDS microanalysis system, LayerProbe is faster, more cost-effective and higher…

INCAEnergy+ combines WDS and EDS to deliver the power of WDS sensitivity and resolution with EDS productivity and ease of use.

Wavelength Dispersive Spectroscopy (WDS) software,…

A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and performance,…