Electron Microscopy

AZtecTEM is an innovative EDS software specifically optimised for advanced TEM applications. AZtecTEM is a unique system approach to the characterisation of materials at the nanoscale.…

Symmetry is the revolutionary all-in-one EBSD detector based on groundbreaking CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and a…

AZtecAM is a powerful, automated, solution for the analysis of metal powders used in additive manufacturing. Based on AZtecFeature, AZtecAM optimises the particle analysis workflow…

OmniProbe 350 is a 3-axis, port mounted manipulator featuring piezoelectric motors with closed loop feedback, ideally suited for routine TEM lamella preparation. Precise and intuitive…

The most powerful EBSD software available, AZtecHKL combines speed and accuracy of results for routine analysis, with the flexibility and power required for applications that push the…

The Pharmaceutical and Biomedical industries require EDS systems to show that their electronic records are trustworthy, reliable, and equivalent to paper records. AZtecPharma is designed…

Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

AZtecLiveOne software platform is the ideal solution for carrying out a complex task like EDS as quickly and as easily as possible. No need for substantial training or advanced knowledge…

AZtecBattery is a powerful, automated, solution for the analysis of powders used in the manufacturing of battery materials and batteries. AZtecBattery is ideal for the detection and…

Relate is a correlative software package optimised to work with EM, EDS, EBSD, & AFM data and images.  It provides the tools you need to correlate data from different microscopes, visualise…

AZtecMineral is a powerful, automated, Mineral Liberation Analysis solution. It enables ore characterisation, provides vital data on metal recovery and enables process yield characterisation…