OmniProbe 350

OmniProbe 350 is a 3-axis, port mounted manipulator featuring piezoelectric motors with closed loop feedback, ideally suited for routine TEM lamella preparation. Precise and intuitive control means you can work quickly and confidently without the risk of damage or sample loss.

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Based on our 9^th generation probe design OmniProbe 350 delivers precise nanoscale control from a compact, port mounted footprint which minimises interference with other detectors and accessories. With a stable probe platform and sub-nanometre piezoelectric motors, our current generation of probes has low vibration, low drift, and superb positioning accuracy, which is combined with our intuitive user interface, where movement direction is calibrated to the image.

The result is class leading performance for routine lift-out and when combined with a variable tilt grid holder OmniProbe 350 can create plan-view and TKD samples without direct handling of the grid or complex multistage lift-out.

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OmniProbe 350

Discover why OmniProbe 350 is the best-in-class 3-axis nanomanipulator for fast and efficient routine TEM Lamella preparation

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Superior linearity - Linearity is a measure of the deviation of the probe tip from the requested movement direction. A probe that moves in a straight line in all directions can:

Lift-out safely, without hitting the side of the trench
Produce TEM lamella faster using smaller milled trenches

Intuitive user interface where controls directly reflect the movement of the probe in the electron image

Smooth continuous motion - Lamella preparation workflows require the probe to make physical contact and smooth motion ensures this can be done without risk of dropping or damaging the sample.

Precise movement with stored positions

Move from fully retracted to operating position with a single click
Save user defined working positions

Stable probe platform - Stability is a combination of vibration and drift. Attaching samples to the probe tip is done by a gas deposition process that can take several minutes. Any drift or vibration of the tip during this process can result in stresses within the sample or sudden movement of the sample at the point it is cut free

The stable Omniprobe platform minimises vibration and drift when idle, reducing these risks

Port mounted design retracts fully within the chamber when not in use so there is no compromise to your microscope

No restriction on sample size
No restriction on stage tilt
No interference with other detectors or accessories

Probe electrical connection includes +/-10V power supply for voltage contrast imaging

Low noise option can be combined with 3rd party electronics to perform EBIC, EBAC, and other electrical testing methods.

Use our handy comparison table below to help you choose the best OmniProbe for your application and to compare specifications.


SPECIFICATION	OMNIPROBE
	OmniProbe 350 Cryo lift-out	OmniProbe 350	OmniProbe 400
Linearity	500 nm	500 nm	250 nm
Encoder resolution	<50nm	<50 nm	10 nm
Insertion repeatability	15 μm*	5 μm	2 μm
Min velocity	50 nm/s	50 nm/s	10 nm/s
Max Velocity	250 μm/s	250 μm/s	500 μm/s
Compucentric rotation	✘	✘	✔
Integrated temperature sensor	✔	✘	✘
Application
Site specific lift-out	✔	✔	✔
Plan-view	P	P	✔
Vent free plan-view	✘	✘	✔
Backside Thinning	✘	✘	P
Atom Probe tomography sample preparation	P	P	✔
Cryogenic liftout	✔	✘	✘
Voltage contrast imaging	✘	✔	✔
Charge neutralisation	✔	✔	✔
On-Tip analysis	✘	✘	✔
EBIC measurements	✘	O	O
EBAC measurements	✘	O	O
In Situ tip change	✘	O	✔