Fabrication

The INCA WAVE WDS spectrometer is the only WDS spectrometer available for SEM that uses the same fully focussing geometry as used in EPMA. This means 2x better resolution and more…

AZtecTEM is an innovative EDS software specifically optimised for advanced TEM applications.

AZtecTEM is a unique system approach to the characterisation of materials at…

LayerProbe is an exciting software tool for thin film analysis in the SEM. An option for the AZtec EDS microanalysis system, LayerProbe is faster, more cost-effective and higher…

AZtecSynergy provides a powerful solution for the simultaneous collection of EDS and EBSD data. All of the tools to collect excellent integrated data are included in one place with…

AZtecLiveOne software platform is the ideal solution for carrying out a complex task like EDS as quickly and as easily as possible. No need for substantial training or advanced knowledge…

The most powerful EBSD software available, AZtecHKL combines speed and accuracy of results for routine analysis, with the flexibility and power required for applications that push…

Ultimate spatial resolution and low energy performance for EDS in the SEM. Combining Extreme electronics and windowless construction with optimised geometry and sensor design delivers…

The X-Max^N Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of…

Our flagship SDD detector for TEM, the X-Max^N 100TLE provides the perfect solution for field emission and aberration corrected TEMs working at the frontiers of nanoscience.

The X-Max^N range of SDD for TEM exploits a new sensor chip, new electronics, and innovative packaging to deliver a truly ‘next generation’ SDD performance.

The industry-leading PORT MOUNTED nanomanipulators for FIB and SEM instruments include this model integrating 100nm closed-loop encoder feedback control for accuracy, flexibility…

AZtec3D combines simultaneous EDS and EBSD data acquisition & analysis with the automated milling capabilities of a FIB-SEM.

This windowless silicon drift detector sensor for TEM applications provides a collection solid angle in the range 0.3 to 0.7 steradians*. Its superb collection efficiency over the…

Symmetry is the revolutionary all-in-one EBSD detector based on groundbreaking CMOS technology. Exceptional performance for all EBSD applications is combined with ease of use and…