15th January 2019 | Author: Zoe Jackson
2018 in Review
It’s been a fantastic year here at the Oxford Instruments NanoAnalysis family.
We kicked off our first quarter with an OI Ruby anniversary. Dr Peter Statham, our Director of R&D, celebrated 40 years of service on January 3rd. Peter has been an integral part of ensuring we remain at the forefront of scientific innovation, even being recognised for his contributions to the field of microscopy at Microscopy & Microanalysis - and we’re honoured by his continuous dedication to Oxford Instruments.
Straddling February and March, Pittcon 2018 brought in the beginning of our event season. We always love getting to know everyone who comes to our booth, and this year at Orlando was no different – it was great to hear about the innovative research that is being undertaken around the globe.
What better way to start the new financial year than with a new product launch? April marked the release of our newest additions to the EBSD detector family: C-Swift and C-Nano. These detectors contain many of the same features as our ground-breaking Symmetry detector, including a customised CMOS sensor which is capable of delivering speed and sensitivity.