JFE Techno-Research Corporation

Ultim Extreme Detector – The start of a new era in SEM/EDS* analysis

Utilising state-of-the-art analytical and testing equipment, JFE Techno-Research Corporation (JFE-TEC) provides highly reliable analysis and characterisation techniques with the aim of being the clients’ best partner for target-driven problem-solving in monodzukuri (Japanese-style manufacturing). In August 2021, JFE-TEC introduced the Oxford Instruments windowless-type EDS detector, Ultim Extreme, which is attached to ultra-low-voltage scanning electron microscopes (ULV-SEM) manufactured by Carl Zeiss. In this Special Case Study, Dr. Kaoru Sato, JFE-TEC Fellow and specialist in microbeam analysis, and Mr. Takaya Nakamura of the company’s Material Analysis Dept. explain why the Ultim Extreme was introduced and how this advanced detector is being used.

Image copyright JFE Techno-Research Corporation. All rights reserved. Reproduced with their kind permission